%0 Journal Article
%A Müller-Caspary, Knut
%A Krause, Florian F.
%A Béché, Armand
%A Duchamp, Martial
%A Schowalter, Marco
%A Löffler, Stefan
%A Migunov, Vadim
%A Winkler, Florian
%A Huth, Martin
%A Ritz, Robert
%A Ihle, Sebastian
%A Simson, Martin
%A Ryll, Henning
%A Soltau, Heike
%A Strüder, Lothar
%A Zweck, Josef
%A Schattschneider, Peter
%A Dunin-Borkowski, Rafal
%A Verbeeck, Johan
%A Rosenauer, Andreas
%T Measurement of Atomic Electric Fields by Scanning Transmission Electron Microscopy (STEM) Employing Ultrafast Detectors
%J Microscopy and microanalysis
%V 22
%N S3
%@ 1435-8115
%C New York, NY
%I Cambridge University Press
%M FZJ-2018-06960
%P 484 - 485
%D 2016
%F PUB:(DE-HGF)16
%9 Journal Article
%R 10.1017/S1431927616003275
%U https://juser.fz-juelich.de/record/858016