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@ARTICLE{MllerCaspary:858016,
      author       = {Müller-Caspary, Knut and Krause, Florian F. and Béché,
                      Armand and Duchamp, Martial and Schowalter, Marco and
                      Löffler, Stefan and Migunov, Vadim and Winkler, Florian and
                      Huth, Martin and Ritz, Robert and Ihle, Sebastian and
                      Simson, Martin and Ryll, Henning and Soltau, Heike and
                      Strüder, Lothar and Zweck, Josef and Schattschneider, Peter
                      and Dunin-Borkowski, Rafal and Verbeeck, Johan and
                      Rosenauer, Andreas},
      title        = {{M}easurement of {A}tomic {E}lectric {F}ields by {S}canning
                      {T}ransmission {E}lectron {M}icroscopy ({STEM}) {E}mploying
                      {U}ltrafast {D}etectors},
      journal      = {Microscopy and microanalysis},
      volume       = {22},
      number       = {S3},
      issn         = {1435-8115},
      address      = {New York, NY},
      publisher    = {Cambridge University Press},
      reportid     = {FZJ-2018-06960},
      pages        = {484 - 485},
      year         = {2016},
      cin          = {ER-C-1},
      ddc          = {500},
      cid          = {I:(DE-Juel1)ER-C-1-20170209},
      pnm          = {143 - Controlling Configuration-Based Phenomena (POF3-143)},
      pid          = {G:(DE-HGF)POF3-143},
      typ          = {PUB:(DE-HGF)16},
      doi          = {10.1017/S1431927616003275},
      url          = {https://juser.fz-juelich.de/record/858016},
}