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| Hauptseite > Publikationsdatenbank > Measurement of Atomic Electric Fields by Scanning Transmission Electron Microscopy (STEM) Employing Ultrafast Detectors > print |
| Hauptseite > Publikationsdatenbank > Measurement of Atomic Electric Fields by Scanning Transmission Electron Microscopy (STEM) Employing Ultrafast Detectors > print |
| 001 | 858016 | ||
| 005 | 20210129235820.0 | ||
| 024 | 7 | _ | |a 10.1017/S1431927616003275 |2 doi |
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| 024 | 7 | _ | |a 1435-8115 |2 ISSN |
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| 245 | _ | _ | |a Measurement of Atomic Electric Fields by Scanning Transmission Electron Microscopy (STEM) Employing Ultrafast Detectors |
| 260 | _ | _ | |a New York, NY |c 2016 |b Cambridge University Press |
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| 773 | _ | _ | |a 10.1017/S1431927616003275 |g Vol. 22, no. S3, p. 484 - 485 |0 PERI:(DE-600)1481716-0 |n S3 |p 484 - 485 |t Microscopy and microanalysis |v 22 |y 2016 |x 1435-8115 |
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