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@PHDTHESIS{Kreysing:858580,
      author       = {Kreysing, Eva Maria},
      title        = {{C}haracterization of the cell-substrate interface using
                      surface plasmon resonance microscopy},
      volume       = {189},
      school       = {RWTH Aachen},
      type         = {Dr.},
      address      = {Jülich},
      publisher    = {Forschungszentrum Jülich GmbH Zentralbibliothek, Verlag},
      reportid     = {FZJ-2018-07450},
      isbn         = {978-3-95806-369-3},
      series       = {Schriften des Forschungszentrums Jülich. Reihe
                      Schlüsseltechnologien / Key Technologies},
      pages        = {XIII, 260 S.},
      year         = {2018},
      note         = {RWTH Aachen, Diss., 2018},
      abstract     = {In this thesis an improved surface plasmon resonance
                      microscopy (SPRM) setup has been developed which combines a
                      projector based SPRM widefield mode with several SPRM
                      scanning modes for the investigation of the cell-substrate
                      interface. Widefield SPRM can be used to image the
                      cell-substrate adhesion areas qualitatively. Here, the
                      resolution is strongly dependent on the light source. While
                      coherent laser light gives rise to speckle noise, which
                      frustrates the resolution of small cellular structures such
                      as neuronal dendrites, using a projector as an incoherent
                      light source allows for a high resolution imaging. Scanning
                      SPRM can be used to determine the cell-substrate distance
                      quantitatively. So far, the accuracy of these measurements
                      was compromised by the assumption of a homogeneous
                      refractive index (RI). In this thesis, it is shown that the
                      RI can be extracted from the SPRM signal at each scanning
                      point at the cell-substrate interface which allowed for an
                      improvement of the distance accuracy by a factor of 25
                      compared to the standard analysis technique realizing a
                      distance accuracy of up to 1.5 nm. The measurements of RI
                      and distance were validated by several reference
                      measurements. The RI of the cell gives interesting insights
                      into the cellular structure and cellular processes. Scanning
                      the cell-substrate interface, it could be shown that the RI
                      profile of a cell can reveal the position of cell organelles
                      and give quantitative values for their refractive indices
                      while the scanning SPRM also allows for the reconstruction
                      of the 3D structure of the basal cell membrane. [...]},
      cin          = {ICS-8},
      cid          = {I:(DE-Juel1)ICS-8-20110106},
      pnm          = {552 - Engineering Cell Function (POF3-552)},
      pid          = {G:(DE-HGF)POF3-552},
      typ          = {PUB:(DE-HGF)3 / PUB:(DE-HGF)11},
      urn          = {urn:nbn:de:0001-2019030702},
      url          = {https://juser.fz-juelich.de/record/858580},
}