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@INPROCEEDINGS{Liu:859086,
author = {Liu, Linjie and Han, Qinghua and Makovejev, Sergej and
Trellenkamp, Stefan and Raskin, Jean-Pierre and Mantl,
Siegfried and Zhao, Qing-Tai},
title = {{A}nalog and {RF} analysis of gate all around silicon
nanowire {MOSFET}s},
address = {[Piscataway, NJ]},
publisher = {IEEE},
reportid = {FZJ-2019-00037},
isbn = {978-1-5090-5313-1},
pages = {1-4},
year = {2017},
abstract = {Gate all around (GAA) nanowire MOSFETs with gate length of
130 nm were fabricated on SOI wafers. The analog performance
was analyzed in terms of transconductance, output
conductance, voltage gain, Early voltage and
transconductance efficiency. The RF characterization showed
relatively low cutoff frequency and maximum oscillation
frequency. Small-signal parameters are extracted using cold
FET method combined with an optimization procedure called
Artificial Bee Colony (ABC) method. It proves that large
parasitic capacitance and high RF output conductance are the
main reasons for the degraded RF performance.},
month = {Apr},
date = {2017-04-03},
organization = {2017 Joint International EUROSOI
Workshop and International Conference
on Ultimate Integration on Silicon
(EUROSOI-ULIS), Athens (Greece), 3 Apr
2017 - 5 Apr 2017},
cin = {PGI-9 / HNF},
cid = {I:(DE-Juel1)PGI-9-20110106 / I:(DE-Juel1)HNF-20170116},
pnm = {521 - Controlling Electron Charge-Based Phenomena
(POF3-521)},
pid = {G:(DE-HGF)POF3-521},
typ = {PUB:(DE-HGF)8 / PUB:(DE-HGF)7},
doi = {10.1109/ULIS.2017.7962575},
url = {https://juser.fz-juelich.de/record/859086},
}