TY  - CONF
AU  - Han, Qinghua
AU  - Tromm, Thomas Carl Ulrich
AU  - Aleksa, Paulus
AU  - Schubert, Jürgen
AU  - Mantl, Siegfried
AU  - Zhao, Qing-Tai
TI  - Impact of Traps in Ferroelectric HfYOx on Negative Capacitance MOSFETs
M1  - FZJ-2019-00047
PY  - 2018
N1  - Extended Abstract
T2  - 2018 IEEE Silicon Nanoelectronics Workshop
CY  - 17 Jun 2018 - 18 Jun 2018, Honolulu (USA)
Y2  - 17 Jun 2018 - 18 Jun 2018
M2  - Honolulu, USA
LB  - PUB:(DE-HGF)6
UR  - https://juser.fz-juelich.de/record/859103
ER  -