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| Hauptseite > Publikationsdatenbank > Impact of Traps in Ferroelectric HfYOx on Negative Capacitance MOSFETs > print |
| Hauptseite > Publikationsdatenbank > Impact of Traps in Ferroelectric HfYOx on Negative Capacitance MOSFETs > print |
| 001 | 859103 | ||
| 005 | 20210130000200.0 | ||
| 037 | _ | _ | |a FZJ-2019-00047 |
| 100 | 1 | _ | |a Han, Qinghua |0 P:(DE-Juel1)165600 |b 0 |
| 111 | 2 | _ | |a 2018 IEEE Silicon Nanoelectronics Workshop |c Honolulu |d 2018-06-17 - 2018-06-18 |w USA |
| 245 | _ | _ | |a Impact of Traps in Ferroelectric HfYOx on Negative Capacitance MOSFETs |
| 260 | _ | _ | |c 2018 |
| 336 | 7 | _ | |a Conference Paper |0 33 |2 EndNote |
| 336 | 7 | _ | |a Other |2 DataCite |
| 336 | 7 | _ | |a INPROCEEDINGS |2 BibTeX |
| 336 | 7 | _ | |a conferenceObject |2 DRIVER |
| 336 | 7 | _ | |a LECTURE_SPEECH |2 ORCID |
| 336 | 7 | _ | |a Conference Presentation |b conf |m conf |0 PUB:(DE-HGF)6 |s 1547546043_11586 |2 PUB:(DE-HGF) |x Other |
| 500 | _ | _ | |a Extended Abstract |
| 536 | _ | _ | |a 521 - Controlling Electron Charge-Based Phenomena (POF3-521) |0 G:(DE-HGF)POF3-521 |c POF3-521 |f POF III |x 0 |
| 700 | 1 | _ | |a Tromm, Thomas Carl Ulrich |0 P:(DE-HGF)0 |b 1 |
| 700 | 1 | _ | |a Aleksa, Paulus |0 P:(DE-HGF)0 |b 2 |
| 700 | 1 | _ | |a Schubert, Jürgen |0 P:(DE-Juel1)128631 |b 3 |
| 700 | 1 | _ | |a Mantl, Siegfried |0 P:(DE-Juel1)128609 |b 4 |
| 700 | 1 | _ | |a Zhao, Qing-Tai |0 P:(DE-Juel1)128649 |b 5 |e Corresponding author |
| 909 | C | O | |o oai:juser.fz-juelich.de:859103 |p VDB |
| 910 | 1 | _ | |a Forschungszentrum Jülich |0 I:(DE-588b)5008462-8 |k FZJ |b 0 |6 P:(DE-Juel1)165600 |
| 910 | 1 | _ | |a Forschungszentrum Jülich |0 I:(DE-588b)5008462-8 |k FZJ |b 1 |6 P:(DE-HGF)0 |
| 910 | 1 | _ | |a Forschungszentrum Jülich |0 I:(DE-588b)5008462-8 |k FZJ |b 2 |6 P:(DE-HGF)0 |
| 910 | 1 | _ | |a Forschungszentrum Jülich |0 I:(DE-588b)5008462-8 |k FZJ |b 3 |6 P:(DE-Juel1)128631 |
| 910 | 1 | _ | |a Forschungszentrum Jülich |0 I:(DE-588b)5008462-8 |k FZJ |b 4 |6 P:(DE-Juel1)128609 |
| 910 | 1 | _ | |a Forschungszentrum Jülich |0 I:(DE-588b)5008462-8 |k FZJ |b 5 |6 P:(DE-Juel1)128649 |
| 913 | 1 | _ | |a DE-HGF |b Key Technologies |l Future Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT) |1 G:(DE-HGF)POF3-520 |0 G:(DE-HGF)POF3-521 |2 G:(DE-HGF)POF3-500 |v Controlling Electron Charge-Based Phenomena |x 0 |4 G:(DE-HGF)POF |3 G:(DE-HGF)POF3 |
| 914 | 1 | _ | |y 2018 |
| 920 | 1 | _ | |0 I:(DE-Juel1)PGI-9-20110106 |k PGI-9 |l Halbleiter-Nanoelektronik |x 0 |
| 980 | _ | _ | |a conf |
| 980 | _ | _ | |a VDB |
| 980 | _ | _ | |a I:(DE-Juel1)PGI-9-20110106 |
| 980 | _ | _ | |a UNRESTRICTED |
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