000859338 001__ 859338
000859338 005__ 20210130000236.0
000859338 037__ $$aFZJ-2019-00206
000859338 041__ $$aEnglish
000859338 1001_ $$0P:(DE-Juel1)161180$$aStange, Daniela$$b0$$eCorresponding author$$ufzj
000859338 1112_ $$aIEEE The International Semiconductor Conference CAS 2018$$cSinaia$$d2018-10-10 - 2018-10-12$$wRomania
000859338 245__ $$aGeSn Lasers
000859338 260__ $$c2018
000859338 3367_ $$033$$2EndNote$$aConference Paper
000859338 3367_ $$2DataCite$$aOther
000859338 3367_ $$2BibTeX$$aINPROCEEDINGS
000859338 3367_ $$2DRIVER$$aconferenceObject
000859338 3367_ $$2ORCID$$aLECTURE_SPEECH
000859338 3367_ $$0PUB:(DE-HGF)6$$2PUB:(DE-HGF)$$aConference Presentation$$bconf$$mconf$$s1547545990_19393$$xAfter Call
000859338 536__ $$0G:(DE-HGF)POF3-521$$a521 - Controlling Electron Charge-Based Phenomena (POF3-521)$$cPOF3-521$$fPOF III$$x0
000859338 7001_ $$0P:(DE-Juel1)161247$$avon den Driesch, Nils$$b1$$ufzj
000859338 7001_ $$0P:(DE-HGF)0$$aZable, Thomas$$b2
000859338 7001_ $$0P:(DE-HGF)0$$aArmand-Pilon, Francesco$$b3
000859338 7001_ $$0P:(DE-Juel1)166341$$aRainko, Denis$$b4$$ufzj
000859338 7001_ $$0P:(DE-Juel1)128639$$aTiedemann, Andreas$$b5$$ufzj
000859338 7001_ $$0P:(DE-HGF)0$$aHartmann, Jean-Michel$$b6
000859338 7001_ $$0P:(DE-HGF)0$$aCapellini, Giovanni$$b7
000859338 7001_ $$0P:(DE-HGF)0$$aIkonic, Zoran$$b8
000859338 7001_ $$0P:(DE-HGF)0$$aSigg, Hans$$b9
000859338 7001_ $$0P:(DE-Juel1)125588$$aGrützmacher, Detlev$$b10$$ufzj
000859338 7001_ $$0P:(DE-Juel1)125569$$aBuca, Dan Mihai$$b11$$ufzj
000859338 909CO $$ooai:juser.fz-juelich.de:859338$$pVDB
000859338 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)161180$$aForschungszentrum Jülich$$b0$$kFZJ
000859338 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)161247$$aForschungszentrum Jülich$$b1$$kFZJ
000859338 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)166341$$aForschungszentrum Jülich$$b4$$kFZJ
000859338 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)128639$$aForschungszentrum Jülich$$b5$$kFZJ
000859338 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)125588$$aForschungszentrum Jülich$$b10$$kFZJ
000859338 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)125569$$aForschungszentrum Jülich$$b11$$kFZJ
000859338 9131_ $$0G:(DE-HGF)POF3-521$$1G:(DE-HGF)POF3-520$$2G:(DE-HGF)POF3-500$$3G:(DE-HGF)POF3$$4G:(DE-HGF)POF$$aDE-HGF$$bKey Technologies$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vControlling Electron Charge-Based Phenomena$$x0
000859338 9141_ $$y2018
000859338 920__ $$lyes
000859338 9201_ $$0I:(DE-Juel1)PGI-9-20110106$$kPGI-9$$lHalbleiter-Nanoelektronik$$x0
000859338 9201_ $$0I:(DE-82)080009_20140620$$kJARA-FIT$$lJARA-FIT$$x1
000859338 980__ $$aconf
000859338 980__ $$aVDB
000859338 980__ $$aI:(DE-Juel1)PGI-9-20110106
000859338 980__ $$aI:(DE-82)080009_20140620
000859338 980__ $$aUNRESTRICTED