000859340 001__ 859340
000859340 005__ 20210130000237.0
000859340 037__ $$aFZJ-2019-00208
000859340 041__ $$aEnglish
000859340 1001_ $$0P:(DE-Juel1)166341$$aRainko, Denis$$b0$$eCorresponding author$$ufzj
000859340 1112_ $$aIEEE The International Semiconductor Conference CAS 2018$$cSinaia$$d2018-10-10 - 2018-10-12$$wRomania
000859340 245__ $$aPossible Optimizations of (Si)Ge(Sn) heterostructures
000859340 260__ $$c2018
000859340 3367_ $$033$$2EndNote$$aConference Paper
000859340 3367_ $$2DataCite$$aOther
000859340 3367_ $$2BibTeX$$aINPROCEEDINGS
000859340 3367_ $$2DRIVER$$aconferenceObject
000859340 3367_ $$2ORCID$$aLECTURE_SPEECH
000859340 3367_ $$0PUB:(DE-HGF)6$$2PUB:(DE-HGF)$$aConference Presentation$$bconf$$mconf$$s1547563311_20785$$xAfter Call
000859340 536__ $$0G:(DE-HGF)POF3-521$$a521 - Controlling Electron Charge-Based Phenomena (POF3-521)$$cPOF3-521$$fPOF III$$x0
000859340 7001_ $$0P:(DE-Juel1)161247$$avon den Driesch, Nils$$b1$$ufzj
000859340 7001_ $$0P:(DE-Juel1)161180$$aStange, Daniela$$b2$$ufzj
000859340 7001_ $$0P:(DE-Juel1)128639$$aTiedemann, Andreas$$b3$$ufzj
000859340 7001_ $$0P:(DE-HGF)0$$aIkonic, Zoran$$b4
000859340 7001_ $$0P:(DE-HGF)0$$aVukmirovic, N.$$b5
000859340 7001_ $$0P:(DE-HGF)0$$aHartmann, Jean-Michel$$b6
000859340 7001_ $$0P:(DE-HGF)0$$aBärwolf, F.$$b7
000859340 7001_ $$0P:(DE-HGF)0$$aCapellini, Giovanni$$b8
000859340 7001_ $$0P:(DE-Juel1)169107$$aKibkalo, Lidia$$b9$$ufzj
000859340 7001_ $$0P:(DE-Juel1)130811$$aLuysberg, Martina$$b10$$ufzj
000859340 7001_ $$0P:(DE-Juel1)168558$$aPovstugar, Ivan$$b11$$ufzj
000859340 7001_ $$0P:(DE-HGF)0$$aElbaz, A.$$b12
000859340 7001_ $$0P:(DE-HGF)0$$aHerth, E.$$b13
000859340 7001_ $$0P:(DE-HGF)0$$aBoucaud, P.$$b14
000859340 7001_ $$0P:(DE-HGF)0$$aEl Kurdi, M.$$b15
000859340 7001_ $$0P:(DE-Juel1)125569$$aBuca, Dan Mihai$$b16$$ufzj
000859340 7001_ $$0P:(DE-Juel1)125588$$aGrützmacher, Detlev$$b17$$ufzj
000859340 909CO $$ooai:juser.fz-juelich.de:859340$$pVDB
000859340 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)166341$$aForschungszentrum Jülich$$b0$$kFZJ
000859340 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)161247$$aForschungszentrum Jülich$$b1$$kFZJ
000859340 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)161180$$aForschungszentrum Jülich$$b2$$kFZJ
000859340 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)128639$$aForschungszentrum Jülich$$b3$$kFZJ
000859340 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)169107$$aForschungszentrum Jülich$$b9$$kFZJ
000859340 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)130811$$aForschungszentrum Jülich$$b10$$kFZJ
000859340 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)168558$$aForschungszentrum Jülich$$b11$$kFZJ
000859340 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)125569$$aForschungszentrum Jülich$$b16$$kFZJ
000859340 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)125588$$aForschungszentrum Jülich$$b17$$kFZJ
000859340 9131_ $$0G:(DE-HGF)POF3-521$$1G:(DE-HGF)POF3-520$$2G:(DE-HGF)POF3-500$$3G:(DE-HGF)POF3$$4G:(DE-HGF)POF$$aDE-HGF$$bKey Technologies$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vControlling Electron Charge-Based Phenomena$$x0
000859340 9141_ $$y2018
000859340 920__ $$lyes
000859340 9201_ $$0I:(DE-Juel1)PGI-9-20110106$$kPGI-9$$lHalbleiter-Nanoelektronik$$x0
000859340 9201_ $$0I:(DE-82)080009_20140620$$kJARA-FIT$$lJARA-FIT$$x1
000859340 9201_ $$0I:(DE-Juel1)PGI-10-20170113$$kPGI-10$$lJARA Institut Green IT$$x2
000859340 9201_ $$0I:(DE-Juel1)ER-C-1-20170209$$kER-C-1$$lPhysik Nanoskaliger Systeme$$x3
000859340 9201_ $$0I:(DE-Juel1)ZEA-3-20090406$$kZEA-3$$lAnalytik$$x4
000859340 980__ $$aconf
000859340 980__ $$aVDB
000859340 980__ $$aI:(DE-Juel1)PGI-9-20110106
000859340 980__ $$aI:(DE-82)080009_20140620
000859340 980__ $$aI:(DE-Juel1)PGI-10-20170113
000859340 980__ $$aI:(DE-Juel1)ER-C-1-20170209
000859340 980__ $$aI:(DE-Juel1)ZEA-3-20090406
000859340 980__ $$aUNRESTRICTED