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@ARTICLE{Kaienburg:859476,
      author       = {Kaienburg, Pascal and Hartnagel, Paula and Pieters, Bart
                      and Yu, Jiaoxian and Grabowski, David and Liu, Zhifa and
                      Haddad, Jinane and Rau, Uwe and Kirchartz, Thomas},
      title        = {{H}ow {C}ontact {L}ayers {C}ontrol {S}hunting {L}osses from
                      {P}inholes in {T}hin-{F}ilm {S}olar {C}ells},
      journal      = {The journal of physical chemistry / C C, Nanomaterials and
                      interfaces},
      volume       = {122},
      number       = {48},
      issn         = {1932-7455},
      address      = {Washington, DC},
      publisher    = {Soc.66306},
      reportid     = {FZJ-2019-00332},
      pages        = {27263 - 27272},
      year         = {2018},
      abstract     = {An absorber layer that does not fully cover the substrate
                      is a common issue for thin-film solar cells such as
                      perovskites. However, models that describe the impact of
                      pinholes on solar cell performance are scarce. Here, we
                      demonstrate that certain combinations of contact layers
                      suppress the negative impact of pinholes better than others.
                      The absence of the absorber at a pinhole gives way to a
                      direct electrical contact between the two semiconducting
                      electron and hole transport layers. The key to understand
                      how pinholes impact the solar cell performance is the
                      resulting nonlinear diodelike behavior of the current across
                      the interface between these two layers (commonly referred to
                      as a shunt current). Based on experimentally obtained data
                      that mimic the current–voltage characteristics across
                      these interfaces, we develop a simple model to predict
                      pinhole-induced solar cell performance deterioration. We
                      investigate typical contact layer combinations such as
                      TiO2/spiro-OMeTAD,
                      poly(3,4-ethylenedioxythiophene)-poly(styrenesulfonate)/phenyl-C61-butyric
                      acid methyl ester, and TiO2/poly(3-hexylthiophene). Our
                      results directly apply to perovskite and other emerging
                      inorganic thin-film solar cells, and the methodology is
                      transferable to CIGS and CdTe. We find substantial
                      differences between five commonly applied contact layer
                      combinations and conclude that it is not sufficient to
                      optimize the contact layers of any real-world thin-film
                      solar cell only with regard to the applied absorber.
                      Instead, in the context of laboratory and industrial
                      fabrication, the tolerance against pinholes (i.e., the
                      mitigation of shunt losses via existing pinholes) needs to
                      be considered as an additional, important objective.},
      cin          = {IEK-5},
      ddc          = {530},
      cid          = {I:(DE-Juel1)IEK-5-20101013},
      pnm          = {121 - Solar cells of the next generation (POF3-121)},
      pid          = {G:(DE-HGF)POF3-121},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000452693300017},
      doi          = {10.1021/acs.jpcc.8b09400},
      url          = {https://juser.fz-juelich.de/record/859476},
}