% IMPORTANT: The following is UTF-8 encoded. This means that in the presence % of non-ASCII characters, it will not work with BibTeX 0.99 or older. % Instead, you should use an up-to-date BibTeX implementation like “bibtex8” or % “biber”. @ARTICLE{Rainko:859840, author = {Rainko, Denis and Ikonic, Zoran and Elbaz, Anas and von den Driesch, Nils and Stange, Daniela and Herth, Etienne and Boucaud, Philippe and El Kurdi, Moustafa and Grützmacher, Detlev and Buca, Dan Mihai}, title = {{I}mpact of tensile strain on low {S}n content {G}e{S}n lasing}, journal = {Scientific reports}, volume = {9}, number = {1}, issn = {2045-2322}, address = {[London]}, publisher = {Macmillan Publishers Limited, part of Springer Nature}, reportid = {FZJ-2019-00662}, pages = {259}, year = {2019}, abstract = {In recent years much effort has been made to increase the Sn content in GeSn alloys in order to increasedirect bandgap charge carrier recombination and, therefore, to reach room temperature lasing.While being successful for the former, the increase of Sn content is detrimental, leading to increaseddefect concentrations and a lower thermal budget regarding processing. In this work we demonstratestrong photoluminescence enhancement in low Sn content Ge0.94Sn0.06 layers by implementing tensilestrain. Fitting of the calculated photoluminescence spectra to reproduce our experimental resultsindicates a strain of $~1.45\%,$ induced via an SiNx stressor layer, which is strong enough to transform theinvestigated layer into a direct bandgap semiconductor. Moreover, theoretical calculations, using the8-band k·p model, show the advantages of using low Sn content tensile strained GeSn layers in respectto gain and lasing temperature. We show that low Sn content GeSn alloys have a strong potential toenable efficient room temperature lasers on electronic-photonic integrated circuits.}, cin = {PGI-9 / JARA-FIT / PGI-10}, ddc = {600}, cid = {I:(DE-Juel1)PGI-9-20110106 / $I:(DE-82)080009_20140620$ / I:(DE-Juel1)PGI-10-20170113}, pnm = {521 - Controlling Electron Charge-Based Phenomena (POF3-521)}, pid = {G:(DE-HGF)POF3-521}, typ = {PUB:(DE-HGF)16}, pubmed = {pmid:30670785}, UT = {WOS:000456282100014}, doi = {10.1038/s41598-018-36837-8}, url = {https://juser.fz-juelich.de/record/859840}, }