000860112 001__ 860112
000860112 005__ 20210130000441.0
000860112 037__ $$aFZJ-2019-00898
000860112 1001_ $$0P:(DE-Juel1)158062$$aMenzel, Stephan$$b0$$ufzj
000860112 1112_ $$aIEEE Nano 2018$$cCork$$d2018-07-23 - 2018-07-26$$wIreland
000860112 245__ $$aMultiscale Simulation of ReRAMs Based on the Valence Change Mechanism
000860112 260__ $$c2018
000860112 3367_ $$033$$2EndNote$$aConference Paper
000860112 3367_ $$2DataCite$$aOther
000860112 3367_ $$2BibTeX$$aINPROCEEDINGS
000860112 3367_ $$2DRIVER$$aconferenceObject
000860112 3367_ $$2ORCID$$aLECTURE_SPEECH
000860112 3367_ $$0PUB:(DE-HGF)6$$2PUB:(DE-HGF)$$aConference Presentation$$bconf$$mconf$$s1548767443_11949$$xInvited
000860112 536__ $$0G:(DE-HGF)POF3-521$$a521 - Controlling Electron Charge-Based Phenomena (POF3-521)$$cPOF3-521$$fPOF III$$x0
000860112 7001_ $$0P:(DE-Juel1)165703$$aFunck, Carsten$$b1$$ufzj
000860112 7001_ $$0P:(DE-HGF)0$$aLa Torre, C.$$b2
000860112 7001_ $$0P:(DE-HGF)0$$aMarchewka, A.$$b3
000860112 909CO $$ooai:juser.fz-juelich.de:860112$$pVDB
000860112 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)158062$$aForschungszentrum Jülich$$b0$$kFZJ
000860112 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)165703$$aForschungszentrum Jülich$$b1$$kFZJ
000860112 9131_ $$0G:(DE-HGF)POF3-521$$1G:(DE-HGF)POF3-520$$2G:(DE-HGF)POF3-500$$3G:(DE-HGF)POF3$$4G:(DE-HGF)POF$$aDE-HGF$$bKey Technologies$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vControlling Electron Charge-Based Phenomena$$x0
000860112 9141_ $$y2018
000860112 9201_ $$0I:(DE-Juel1)PGI-7-20110106$$kPGI-7$$lElektronische Materialien$$x0
000860112 9201_ $$0I:(DE-82)080009_20140620$$kJARA-FIT$$lJARA-FIT$$x1
000860112 980__ $$aconf
000860112 980__ $$aVDB
000860112 980__ $$aI:(DE-Juel1)PGI-7-20110106
000860112 980__ $$aI:(DE-82)080009_20140620
000860112 980__ $$aUNRESTRICTED