000860248 001__ 860248
000860248 005__ 20240610120306.0
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000860248 0247_ $$2ISSN$$a1866-1807
000860248 020__ $$a978-3-95806-383-9
000860248 037__ $$aFZJ-2019-01032
000860248 041__ $$aEnglish
000860248 1001_ $$0P:(DE-Juel1)161387$$aWinkler, Florian$$b0$$eCorresponding author$$gmale$$ufzj
000860248 245__ $$aAbsolute scale off-axis electron holography of thin dichalcogenide crystals at atomic resolution$$f- 2018
000860248 260__ $$aJülich$$bForschungszentrum Jülich GmbH Zentralbibliothek, Verlag$$c2019
000860248 300__ $$aXXIII, 187 S.
000860248 3367_ $$2DataCite$$aOutput Types/Dissertation
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000860248 3367_ $$2ORCID$$aDISSERTATION
000860248 3367_ $$2BibTeX$$aPHDTHESIS
000860248 3367_ $$02$$2EndNote$$aThesis
000860248 3367_ $$0PUB:(DE-HGF)11$$2PUB:(DE-HGF)$$aDissertation / PhD Thesis$$bphd$$mphd$$s1548949993_27781
000860248 3367_ $$2DRIVER$$adoctoralThesis
000860248 4900_ $$aSchriften des Forschungszentrums Jülich. Reihe Schlüsseltechnologien / Key Technologies$$v191
000860248 502__ $$aRWTH Aachen, Diss., 2018$$bDr.$$cRWTH Aachen$$d2018
000860248 520__ $$aHigh-resolution transmission electron microscopy (HRTEM) is an enormously powerful technique for the investigation of material structures at atomic resolution. In addition, off-axis electron holography allows information to be obtained about electromagnetic fields inside and around the object. However, due to electron diffraction in the sample and subsequent electron optical imaging, the extraction of quantitative information from recorded images is by no means a trivial task, as information related to the object structure, electromagnetic fields and microscope properties are encoded in the recorded signal in a highly complex manner. The comparison of experimental data with accurate simulations, ideally on the same absolute scale, is a common approach in HRTEM to extract pure information about objects and fields. Prior to this work, absolute scale agreements had only been achieved manually in a few cases for HRTEM, but had not been demonstrated for off-axis electron holography. In this work, an automated optimization procedure is developed that enables the determination of unknown or only partially known experimental parameters directly from high-resolution electron wave functions measured using off-axis electron holography. The procedure is applied to the study of two-dimensional WSe$_{2}$, yielding one of the most precise local specimen orientation measurements that has been achieved in TEM for ultra-thin samples. Extensive tests on simulated data reveal that diffraction-related parameters, such as specimen tilt or absorption, can be determined unambiguously with extremely high accuracy and precision, even in the presence of realistic recording noise. In contrast, coherent aberration coefficients cannot be determined unambiguously from electron wavefunctions of periodic objects. By applying the procedure to a recorded off-axis electron hologram of five-layer-thick WSe$_{2}$, absolute scale agreement between experiment and simulation is achieved, which is limited primarily by the experimental recording noise. The automated procedure developed in this work is fast and computationally cheap. In comparison to previous manual optimizations, it is less prone to human error and bias. This work represents a significant advance for quantitative electron microscopy in general, as the procedure is not limited to off-axis electron holography, but can also be applied to HRTEM and other techniques.
000860248 536__ $$0G:(DE-HGF)POF3-143$$a143 - Controlling Configuration-Based Phenomena (POF3-143)$$cPOF3-143$$fPOF III$$x0
000860248 8564_ $$uhttps://juser.fz-juelich.de/record/860248/files/Schluesseltech_191.pdf$$yOpenAccess
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000860248 9141_ $$y2019
000860248 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)161387$$aForschungszentrum Jülich$$b0$$kFZJ
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000860248 920__ $$lyes
000860248 9201_ $$0I:(DE-Juel1)PGI-5-20110106$$kPGI-5$$lMikrostrukturforschung$$x0
000860248 9201_ $$0I:(DE-Juel1)ER-C-1-20170209$$kER-C-1$$lPhysik Nanoskaliger Systeme$$x1
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