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@PHDTHESIS{Winkler:860248,
      author       = {Winkler, Florian},
      title        = {{A}bsolute scale off-axis electron holography of thin
                      dichalcogenide crystals at atomic resolution},
      volume       = {191},
      school       = {RWTH Aachen},
      type         = {Dr.},
      address      = {Jülich},
      publisher    = {Forschungszentrum Jülich GmbH Zentralbibliothek, Verlag},
      reportid     = {FZJ-2019-01032},
      isbn         = {978-3-95806-383-9},
      series       = {Schriften des Forschungszentrums Jülich. Reihe
                      Schlüsseltechnologien / Key Technologies},
      pages        = {XXIII, 187 S.},
      year         = {2019},
      note         = {RWTH Aachen, Diss., 2018},
      abstract     = {High-resolution transmission electron microscopy (HRTEM) is
                      an enormously powerful technique for the investigation of
                      material structures at atomic resolution. In addition,
                      off-axis electron holography allows information to be
                      obtained about electromagnetic fields inside and around the
                      object. However, due to electron diffraction in the sample
                      and subsequent electron optical imaging, the extraction of
                      quantitative information from recorded images is by no means
                      a trivial task, as information related to the object
                      structure, electromagnetic fields and microscope properties
                      are encoded in the recorded signal in a highly complex
                      manner. The comparison of experimental data with accurate
                      simulations, ideally on the same absolute scale, is a common
                      approach in HRTEM to extract pure information about objects
                      and fields. Prior to this work, absolute scale agreements
                      had only been achieved manually in a few cases for HRTEM,
                      but had not been demonstrated for off-axis electron
                      holography. In this work, an automated optimization
                      procedure is developed that enables the determination of
                      unknown or only partially known experimental parameters
                      directly from high-resolution electron wave functions
                      measured using off-axis electron holography. The procedure
                      is applied to the study of two-dimensional WSe$_{2}$,
                      yielding one of the most precise local specimen orientation
                      measurements that has been achieved in TEM for ultra-thin
                      samples. Extensive tests on simulated data reveal that
                      diffraction-related parameters, such as specimen tilt or
                      absorption, can be determined unambiguously with extremely
                      high accuracy and precision, even in the presence of
                      realistic recording noise. In contrast, coherent aberration
                      coefficients cannot be determined unambiguously from
                      electron wavefunctions of periodic objects. By applying the
                      procedure to a recorded off-axis electron hologram of
                      five-layer-thick WSe$_{2}$, absolute scale agreement between
                      experiment and simulation is achieved, which is limited
                      primarily by the experimental recording noise. The automated
                      procedure developed in this work is fast and computationally
                      cheap. In comparison to previous manual optimizations, it is
                      less prone to human error and bias. This work represents a
                      significant advance for quantitative electron microscopy in
                      general, as the procedure is not limited to off-axis
                      electron holography, but can also be applied to HRTEM and
                      other techniques.},
      cin          = {PGI-5 / ER-C-1},
      cid          = {I:(DE-Juel1)PGI-5-20110106 / I:(DE-Juel1)ER-C-1-20170209},
      pnm          = {143 - Controlling Configuration-Based Phenomena (POF3-143)},
      pid          = {G:(DE-HGF)POF3-143},
      typ          = {PUB:(DE-HGF)3 / PUB:(DE-HGF)11},
      url          = {https://juser.fz-juelich.de/record/860248},
}