% IMPORTANT: The following is UTF-8 encoded.  This means that in the presence
% of non-ASCII characters, it will not work with BibTeX 0.99 or older.
% Instead, you should use an up-to-date BibTeX implementation like “bibtex8” or
% “biber”.

@ARTICLE{Jing:860279,
      author       = {Jing, Hong-Mei and Cheng, Sheng and Mi, Shao-Bo and Lu, Lu
                      and Liu, Ming and Cheng, Shao-Dong and Jia, Chun-Lin},
      title        = {{F}ormation of {R}uddlesden–{P}opper {F}aults and {T}heir
                      {E}ffect on the {M}agnetic {P}roperties in {P}r 0.5 {S}r 0.5
                      {C}o{O} 3 {T}hin {F}ilms},
      journal      = {ACS applied materials $\&$ interfaces},
      volume       = {10},
      number       = {1},
      issn         = {1944-8252},
      address      = {Washington, DC},
      publisher    = {Soc.},
      reportid     = {FZJ-2019-01054},
      pages        = {1428 - 1433},
      year         = {2018},
      abstract     = {Epitaxial Pr0.5Sr0.5CoO3 thin films have been grown on
                      single-crystalline (La0.289Sr0.712)(Al0.633Ta0.356)O3(001)
                      substrates by the pulsed laser deposition technique. The
                      magnetic properties and microstructure of these films are
                      investigated. It is found that Ruddlesden–Popper faults
                      (RP faults) can be introduced in the films by changing the
                      laser repetition rate. The segregation of Pr at the RP
                      faults is characterized by atomic-resolution chemical
                      mapping. The formation of the RP faults not only contributes
                      to the epitaxial strain relaxation but also significantly
                      decreases the ferromagnetic long-range order of the films,
                      resulting in lower magnetizations than those of the
                      fault-free films. Our results provide a strategy for tuning
                      the magnetic properties of cobalt-based perovskite films by
                      modifying the microstructure through the film growth
                      process.},
      cin          = {ER-C-1},
      ddc          = {600},
      cid          = {I:(DE-Juel1)ER-C-1-20170209},
      pnm          = {143 - Controlling Configuration-Based Phenomena (POF3-143)},
      pid          = {G:(DE-HGF)POF3-143},
      typ          = {PUB:(DE-HGF)16},
      pubmed       = {pmid:29250959},
      UT           = {WOS:000422814400155},
      doi          = {10.1021/acsami.7b16341},
      url          = {https://juser.fz-juelich.de/record/860279},
}