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@ARTICLE{Jia:860285,
      author       = {Jia, Chun-Lin and Mi, Shao-Bo and Jin, Lei},
      title        = {{Q}uantitative {HRTEM} and its application in the study of
                      oxide materials},
      journal      = {Chinese physics / B B},
      volume       = {27},
      number       = {5},
      issn         = {1674-1056},
      address      = {London},
      publisher    = {Inst. of Physics},
      reportid     = {FZJ-2019-01060},
      pages        = {056803 -},
      year         = {2018},
      abstract     = {On the basis of a state-of-the-art aberration-corrected
                      transmission electron microscope, the spherical aberration
                      coefficient C S of the objective lens can be tuned to either
                      a positive or a negative value. The use of a negative value
                      of C S combined with an overfocus setting of the objective
                      lens leads to the development of the negative C S imaging
                      (NCSI) technique. Images obtained using the NCSI technique
                      show superior contrast and signal intensity at atomic column
                      positions than the corresponding positive C S images,
                      especially for weakly scattering oxygen columns that are in
                      close proximity to strongly scattering cation columns in
                      oxides. Based on the images obtained under the NCSI
                      condition, quantification of the image contrast allows
                      measurements of the atom positions with a precision of a few
                      picometers and the local chemistry on atomic scale. In the
                      present review, we discuss firstly the benefits of the NCSI
                      technique in studies of oxide materials, and then show a
                      procedure for quantitative analysis of the image based on
                      the absolute value of contrast. In the last part, examples
                      are given for the application of the quantitative
                      high-resolution transmission electron microscopy (HRTEM) to
                      the study of electric dipoles of oxide ferroelectrics and
                      atomic-scale chemistry of interfaces.},
      cin          = {ER-C-1},
      ddc          = {530},
      cid          = {I:(DE-Juel1)ER-C-1-20170209},
      pnm          = {143 - Controlling Configuration-Based Phenomena (POF3-143)},
      pid          = {G:(DE-HGF)POF3-143},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000432668900003},
      doi          = {10.1088/1674-1056/27/5/056803},
      url          = {https://juser.fz-juelich.de/record/860285},
}