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@ARTICLE{Persson:860468,
author = {Persson, J. S. and Tiwari, A. and Valbahs, E. and
Tolpekina, T. V. and Persson, Bo},
title = {{O}n the {U}se of {S}ilicon {R}ubber {R}eplica for
{S}urface {T}opography {S}tudies},
journal = {Tribology letters},
volume = {66},
number = {4},
issn = {1573-2711},
address = {Dordrecht},
publisher = {Springer Science Business Media B.V.},
reportid = {FZJ-2019-01222},
pages = {140},
year = {2018},
abstract = {Silicone rubber is often used to obtain replica of surfaces
which are hard to study directly. Here we discuss under what
conditions engineering stylus measurements can be used to
obtain the correct surface roughness from the replica. We
also show how thin vertical slices of the silicone rubber
can be used to obtain the surface roughness power spectra
for the long-wavelength roughness on even very rough
surfaces, such as road surfaces, which may be hard to probe
directly with standard optical or stylus instruments.},
cin = {IAS-1 / PGI-1 / JARA-FIT / JARA-HPC},
ddc = {670},
cid = {I:(DE-Juel1)IAS-1-20090406 / I:(DE-Juel1)PGI-1-20110106 /
$I:(DE-82)080009_20140620$ / $I:(DE-82)080012_20140620$},
pnm = {141 - Controlling Electron Charge-Based Phenomena
(POF3-141)},
pid = {G:(DE-HGF)POF3-141},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000448429700001},
doi = {10.1007/s11249-018-1092-0},
url = {https://juser.fz-juelich.de/record/860468},
}