Hauptseite > Publikationsdatenbank > Investigation of Negative Capacitance and Junctionless MOSFETs for CMOS Scaling > EndNote Text |
%0 Thesis %A Han, Qinghua %T Investigation of Negative Capacitance and Junctionless MOSFETs for CMOS Scaling %I RWTH Aachen %V Dissertation %M FZJ-2019-01570 %P 114 %D 2019 %Z Dissertation, RWTH Aachen, 2018 %F PUB:(DE-HGF)11 %9 Dissertation / PhD Thesis %U https://juser.fz-juelich.de/record/860918