000860918 001__ 860918
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000860918 037__ $$aFZJ-2019-01570
000860918 1001_ $$0P:(DE-Juel1)165600$$aHan, Qinghua$$b0$$eCorresponding author$$ufzj
000860918 245__ $$aInvestigation of Negative Capacitance and Junctionless MOSFETs for CMOS Scaling$$f - 2018-11-30
000860918 260__ $$c2019
000860918 300__ $$a114
000860918 3367_ $$2DataCite$$aOutput Types/Dissertation
000860918 3367_ $$2ORCID$$aDISSERTATION
000860918 3367_ $$2BibTeX$$aPHDTHESIS
000860918 3367_ $$02$$2EndNote$$aThesis
000860918 3367_ $$0PUB:(DE-HGF)11$$2PUB:(DE-HGF)$$aDissertation / PhD Thesis$$bphd$$mphd$$s1550742999_32623
000860918 3367_ $$2DRIVER$$adoctoralThesis
000860918 502__ $$aDissertation, RWTH Aachen, 2018$$bDissertation$$cRWTH Aachen$$d2018$$o2018-11-23
000860918 536__ $$0G:(DE-HGF)POF3-521$$a521 - Controlling Electron Charge-Based Phenomena (POF3-521)$$cPOF3-521$$fPOF III$$x0
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000860918 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)165600$$aForschungszentrum Jülich$$b0$$kFZJ
000860918 9131_ $$0G:(DE-HGF)POF3-521$$1G:(DE-HGF)POF3-520$$2G:(DE-HGF)POF3-500$$3G:(DE-HGF)POF3$$4G:(DE-HGF)POF$$aDE-HGF$$bKey Technologies$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vControlling Electron Charge-Based Phenomena$$x0
000860918 9141_ $$y2019
000860918 9201_ $$0I:(DE-Juel1)PGI-9-20110106$$kPGI-9$$lHalbleiter-Nanoelektronik$$x0
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