Hauptseite > Publikationsdatenbank > Investigation of Negative Capacitance and Junctionless MOSFETs for CMOS Scaling > RIS |
TY - THES AU - Han, Qinghua TI - Investigation of Negative Capacitance and Junctionless MOSFETs for CMOS Scaling PB - RWTH Aachen VL - Dissertation M1 - FZJ-2019-01570 SP - 114 PY - 2019 N1 - Dissertation, RWTH Aachen, 2018 LB - PUB:(DE-HGF)11 UR - https://juser.fz-juelich.de/record/860918 ER -