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@ARTICLE{Barthel:861048,
author = {Barthel, Juri},
title = {{D}r. {P}robe: {A} software for high-resolution {STEM}
image simulation},
journal = {Ultramicroscopy},
volume = {193},
issn = {0304-3991},
address = {Amsterdam},
publisher = {Elsevier Science},
reportid = {FZJ-2019-01632},
pages = {1 - 11},
year = {2018},
abstract = {The Dr. Probe software for multislice simulations of STEM
images is introduced, and reference is given of the applied
methods. Major program features available with the graphical
user interface version are demonstrated by means of a few
examples for bright-field and dark-field STEM imaging as
well as simulations of diffraction patterns. The numerical
procedure applied for the simulation of thermal-diffuse
scattering by the frozen-lattice approach is described in
detail. Intensity variations occurring in simulations with
atomic-column resolution due to frozen-lattice variations
are discussed in the context of atom counting. It is found
that a significant averaging over many lattice
configurations with different random atomic displacements is
required to prevent atom-counting bias from simulations. A
strategy is developed for the assessment of the amount of
required averaging based on the estimated signal variance
and the expected signal gain per atom in a column.},
cin = {ER-C-2 / PGI-5},
ddc = {570},
cid = {I:(DE-Juel1)ER-C-2-20170209 / I:(DE-Juel1)PGI-5-20110106},
pnm = {143 - Controlling Configuration-Based Phenomena (POF3-143)},
pid = {G:(DE-HGF)POF3-143},
typ = {PUB:(DE-HGF)16},
pubmed = {pmid:29906518},
UT = {WOS:000444834300001},
doi = {10.1016/j.ultramic.2018.06.003},
url = {https://juser.fz-juelich.de/record/861048},
}