%0 Conference Paper
%A Roth, Christian
%A van Waasen, Stefan
%T Verification of a 65nm CMOS IC for various applications (neutrino detection, high energy physics, etc.)
%M FZJ-2019-01810
%D 2018
%X Verification of a 65nm CMOS IC for various applications (neutrino detection, high energy physics, etc.)
%B SEI Tagung 2018
%C 16 Apr 2018 - 18 Apr 2018, Dresden (Germany)
Y2 16 Apr 2018 - 18 Apr 2018
M2 Dresden, Germany
%F PUB:(DE-HGF)6
%9 Conference Presentation
%U https://juser.fz-juelich.de/record/861320