000861320 001__ 861320
000861320 005__ 20250129092406.0
000861320 0247_ $$2Handle$$a2128/22865
000861320 037__ $$aFZJ-2019-01810
000861320 041__ $$aEnglish
000861320 1001_ $$0P:(DE-Juel1)171480$$aRoth, Christian$$b0$$eCorresponding author
000861320 1112_ $$aSEI Tagung 2018$$cDresden$$d2018-04-16 - 2018-04-18$$gSEI2018$$wGermany
000861320 245__ $$aVerification of a 65nm CMOS IC for various applications (neutrino detection, high energy physics, etc.)
000861320 260__ $$c2018
000861320 3367_ $$033$$2EndNote$$aConference Paper
000861320 3367_ $$2DataCite$$aOther
000861320 3367_ $$2BibTeX$$aINPROCEEDINGS
000861320 3367_ $$2DRIVER$$aconferenceObject
000861320 3367_ $$2ORCID$$aLECTURE_SPEECH
000861320 3367_ $$0PUB:(DE-HGF)6$$2PUB:(DE-HGF)$$aConference Presentation$$bconf$$mconf$$s1568869828_27158$$xAfter Call
000861320 520__ $$aVerification of a 65nm CMOS IC for various applications (neutrino detection, high energy physics, etc.)
000861320 536__ $$0G:(DE-HGF)POF3-632$$a632 - Detector technology and systems (POF3-632)$$cPOF3-632$$fPOF III$$x0
000861320 65027 $$0V:(DE-MLZ)SciArea-220$$2V:(DE-HGF)$$aInstrument and Method Development$$x0
000861320 65017 $$0V:(DE-MLZ)GC-2002-2016$$2V:(DE-HGF)$$aInstrument and Method Development$$x0
000861320 7001_ $$0P:(DE-Juel1)142562$$avan Waasen, Stefan$$b1$$ufzj
000861320 8564_ $$uhttps://indico.desy.de/indico/event/19389/picture/20.pdf
000861320 8564_ $$uhttps://juser.fz-juelich.de/record/861320/files/Verification%20of%20a%2065nm%20CMOS%20IC%20for%20various%20applications.pdf$$yOpenAccess
000861320 909CO $$ooai:juser.fz-juelich.de:861320$$pdriver$$pVDB$$popen_access$$popenaire
000861320 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)171480$$aForschungszentrum Jülich$$b0$$kFZJ
000861320 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)142562$$aForschungszentrum Jülich$$b1$$kFZJ
000861320 9131_ $$0G:(DE-HGF)POF3-632$$1G:(DE-HGF)POF3-630$$2G:(DE-HGF)POF3-600$$3G:(DE-HGF)POF3$$4G:(DE-HGF)POF$$aDE-HGF$$bForschungsbereich Materie$$lMaterie und Technologie$$vDetector technology and systems$$x0
000861320 9141_ $$y2019
000861320 915__ $$0StatID:(DE-HGF)0510$$2StatID$$aOpenAccess
000861320 920__ $$lyes
000861320 9201_ $$0I:(DE-Juel1)ZEA-2-20090406$$kZEA-2$$lZentralinstitut für Elektronik$$x0
000861320 9801_ $$aFullTexts
000861320 980__ $$aconf
000861320 980__ $$aVDB
000861320 980__ $$aUNRESTRICTED
000861320 980__ $$aI:(DE-Juel1)ZEA-2-20090406
000861320 981__ $$aI:(DE-Juel1)PGI-4-20110106