TY  - CONF
AU  - Roth, Christian
AU  - van Waasen, Stefan
TI  - Verification of a 65nm CMOS IC for various applications (neutrino detection, high energy physics, etc.)
M1  - FZJ-2019-01810
PY  - 2018
AB  - Verification of a 65nm CMOS IC for various applications (neutrino detection, high energy physics, etc.)
T2  - SEI Tagung 2018
CY  - 16 Apr 2018 - 18 Apr 2018, Dresden (Germany)
Y2  - 16 Apr 2018 - 18 Apr 2018
M2  - Dresden, Germany
LB  - PUB:(DE-HGF)6
UR  - https://juser.fz-juelich.de/record/861320
ER  -