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@INPROCEEDINGS{Roth:861320,
      author       = {Roth, Christian and van Waasen, Stefan},
      title        = {{V}erification of a 65nm {CMOS} {IC} for various
                      applications (neutrino detection, high energy physics,
                      etc.)},
      reportid     = {FZJ-2019-01810},
      year         = {2018},
      abstract     = {Verification of a 65nm CMOS IC for various applications
                      (neutrino detection, high energy physics, etc.)},
      month         = {Apr},
      date          = {2018-04-16},
      organization  = {SEI Tagung 2018, Dresden (Germany), 16
                       Apr 2018 - 18 Apr 2018},
      subtyp        = {After Call},
      cin          = {ZEA-2},
      cid          = {I:(DE-Juel1)ZEA-2-20090406},
      pnm          = {632 - Detector technology and systems (POF3-632)},
      pid          = {G:(DE-HGF)POF3-632},
      typ          = {PUB:(DE-HGF)6},
      url          = {https://juser.fz-juelich.de/record/861320},
}