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| Hauptseite > Publikationsdatenbank > Verification of a 65nm CMOS IC for various applications (neutrino detection, high energy physics, etc.) > print |
| Hauptseite > Publikationsdatenbank > Verification of a 65nm CMOS IC for various applications (neutrino detection, high energy physics, etc.) > print |
| 001 | 861320 | ||
| 005 | 20250129092406.0 | ||
| 024 | 7 | _ | |a 2128/22865 |2 Handle |
| 037 | _ | _ | |a FZJ-2019-01810 |
| 041 | _ | _ | |a English |
| 100 | 1 | _ | |a Roth, Christian |0 P:(DE-Juel1)171480 |b 0 |e Corresponding author |
| 111 | 2 | _ | |a SEI Tagung 2018 |g SEI2018 |c Dresden |d 2018-04-16 - 2018-04-18 |w Germany |
| 245 | _ | _ | |a Verification of a 65nm CMOS IC for various applications (neutrino detection, high energy physics, etc.) |
| 260 | _ | _ | |c 2018 |
| 336 | 7 | _ | |a Conference Paper |0 33 |2 EndNote |
| 336 | 7 | _ | |a Other |2 DataCite |
| 336 | 7 | _ | |a INPROCEEDINGS |2 BibTeX |
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| 520 | _ | _ | |a Verification of a 65nm CMOS IC for various applications (neutrino detection, high energy physics, etc.) |
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| 700 | 1 | _ | |a van Waasen, Stefan |0 P:(DE-Juel1)142562 |b 1 |u fzj |
| 856 | 4 | _ | |u https://indico.desy.de/indico/event/19389/picture/20.pdf |
| 856 | 4 | _ | |u https://juser.fz-juelich.de/record/861320/files/Verification%20of%20a%2065nm%20CMOS%20IC%20for%20various%20applications.pdf |y OpenAccess |
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