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@ARTICLE{Tavabi:862488,
      author       = {Tavabi, Amir Hossein and Boothroyd, Christopher Brian and
                      Yücelen, Emrah and Frabboni, Stefano and Gazzadi, Gian
                      Carlo and Dunin-Borkowski, Rafal E. and Pozzi, Giulio},
      title        = {{T}he {Y}oung-{F}eynman controlled double-slit electron
                      interference experiment},
      journal      = {Scientific reports},
      volume       = {9},
      number       = {1},
      issn         = {2045-2322},
      address      = {[London]},
      publisher    = {Macmillan Publishers Limited, part of Springer Nature},
      reportid     = {FZJ-2019-02794},
      pages        = {10458},
      year         = {2019},
      abstract     = {The key features of quantum mechanics are vividly
                      illustrated by the Young-Feynman two-slit thought
                      experiment, whose second part discusses the recording of an
                      electron distribution with one of the two slits partially or
                      totally closed by an aperture. Here, we realize the original
                      Feynman proposal in a modern electron microscope equipped
                      with a high brightness gun and two biprisms, with one of the
                      biprisms used as a mask. By exciting the microscope lenses
                      to conjugate the biprism plane with the slit plane,
                      observations are carried out in the Fraunhofer plane with
                      nearly ideal control of the covering of one of the slits. A
                      second, new experiment is also presented, in which
                      interference phenomena due to partial overlap of the slits
                      are observed in the image plane. This condition is obtained
                      by inserting the second biprism between the two slits and
                      the first biprism and by biasing it in order to overlap
                      their images.},
      cin          = {ER-C-1},
      ddc          = {600},
      cid          = {I:(DE-Juel1)ER-C-1-20170209},
      pnm          = {143 - Controlling Configuration-Based Phenomena (POF3-143)
                      / ESTEEM3 - Enabling Science and Technology through European
                      Electron Microscopy (823717)},
      pid          = {G:(DE-HGF)POF3-143 / G:(EU-Grant)823717},
      typ          = {PUB:(DE-HGF)16},
      pubmed       = {pmid:31320696},
      UT           = {WOS:000475845400062},
      doi          = {10.1038/s41598-019-43323-2},
      url          = {https://juser.fz-juelich.de/record/862488},
}