% IMPORTANT: The following is UTF-8 encoded.  This means that in the presence
% of non-ASCII characters, it will not work with BibTeX 0.99 or older.
% Instead, you should use an up-to-date BibTeX implementation like “bibtex8” or
% “biber”.

@ARTICLE{Wagner:863513,
      author       = {Wagner, Christian and Green, Matthew. F. B. and Maiworm,
                      Michael and Leinen, Philipp and Esat, Taner and Ferri,
                      Nicola and Friedrich, Niklas and Findeisen, Rolf and
                      Tkatchenko, Alexandre and Temirov, Ruslan and Tautz, F.
                      Stefan},
      title        = {{Q}uantitative imaging of electric surface potentials with
                      single-atom sensitivity},
      journal      = {Nature materials},
      volume       = {18},
      issn         = {1476-4660},
      address      = {Basingstoke},
      publisher    = {Nature Publishing Group},
      reportid     = {FZJ-2019-03562},
      pages        = {853–859},
      year         = {2019},
      note         = {ERC-StG 757634 CM3},
      abstract     = {Because materials consist of positive nuclei and negative
                      electrons, electric potentials are omnipresent at the atomic
                      scale. However, due to the long range of the Coulomb
                      interaction, large-scale structures completely outshine
                      small ones. This makes the isolation and quantification of
                      the electric potentials that originate from nanoscale
                      objects such as atoms or molecules very challenging. Here we
                      report a non-contact scanning probe technique that addresses
                      this challenge. It exploits a quantum dot sensor and the
                      joint electrostatic screening by tip and surface, thus
                      enabling quantitative surface potential imaging across all
                      relevant length scales down to single atoms. We apply the
                      technique to the characterization of a nanostructured
                      surface, thereby extracting workfunction changes and dipole
                      moments for important reference systems. This authenticates
                      the method as a versatile tool to study the building blocks
                      of materials and devices down to the atomic scale.},
      cin          = {PGI-3 / JARA-FIT},
      ddc          = {610},
      cid          = {I:(DE-Juel1)PGI-3-20110106 / $I:(DE-82)080009_20140620$},
      pnm          = {141 - Controlling Electron Charge-Based Phenomena
                      (POF3-141)},
      pid          = {G:(DE-HGF)POF3-141},
      typ          = {PUB:(DE-HGF)16},
      pubmed       = {pmid:31182779},
      UT           = {WOS:000476651600019},
      doi          = {10.1038/s41563-019-0382-8},
      url          = {https://juser.fz-juelich.de/record/863513},
}