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@ARTICLE{Kreter:863535,
author = {Kreter, A. and Nishijima, D. and Doerner, R. P. and
Freisinger, M. and Linsmeier, Ch. and Martynova, Y. and
Möller, S. and Rasinski, M. and Reinhart, M. and Terra, A.
and Torikai, Y. and Unterberg, B.},
title = {{I}nfluence of plasma impurities on the fuel retention in
tungsten},
journal = {Nuclear fusion},
volume = {59},
number = {8},
issn = {1741-4326},
address = {Vienna},
publisher = {IAEA},
reportid = {FZJ-2019-03574},
pages = {086029 -},
year = {2019},
abstract = {The retention of radioactive tritium in the reactor wall is
a safety issue and should be kept to a minimum. We
investigated the influence of helium, argon, neon and
nitrogen as plasma impurities on the deuterium retention in
tungsten in the linear plasma devices PSI-2 and PISCES-A.
Following mixed plasmas were produced: pure D,
D + He, D + Ar, D + Ne,
D + N and D + He + Ar, with
impurity fractions between $3\%$ and $10\%.$ Experiments
were performed at tungsten sample temperatures of 500 and
770 K. The incident ion energy was 70 eV, above the
tungsten sputtering threshold for argon and nitrogen, but
below it for deuterium and helium. For neon, in addition, it
was varied between 20 and 70 eV, below and above the
tungsten sputtering threshold, respectively. The admixture
of helium reduced the deuterium retention by a factor of
3–100, with a stronger reduction at a higher sample
temperature. In the D + He + Ar case the
retention was similar as for pure D. Argon sputtered the
near-surface helium nanobubble layer and thus overrode the
effect of helium. The effect of neon is sensitive to the
incident ion energy. Addition of nitrogen increased the
deuterium retention by a factor of ~10 and ~100 for 500 and
770 K, respectively. In general, the effect of impurities
on the deuterium retention appears to be sensitive to the
properties of the affected near-surface layer of tungsten.
Admixed species, i.e. helium, can form a layer with open
porosity, which serves as an additional release channel for
deuterium thus decreasing the retention. However, if the
process is dominated by sputtering, as for argon, such a
layer cannot be formed. The nitrogen enriched layer, in
contrast, serves as a desorption barrier for deuterium
increasing the retention.},
cin = {IEK-4 / IEK-1},
ddc = {620},
cid = {I:(DE-Juel1)IEK-4-20101013 / I:(DE-Juel1)IEK-1-20101013},
pnm = {113 - Methods and Concepts for Material Development
(POF3-113)},
pid = {G:(DE-HGF)POF3-113},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000473496000001},
doi = {10.1088/1741-4326/ab235d},
url = {https://juser.fz-juelich.de/record/863535},
}