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000863536 1001_ $$0P:(DE-Juel1)145528$$aHellwig, Maren$$b0$$eCorresponding author
000863536 245__ $$aImpact of Surface Roughness on Ion-Surface Interactions Studied with Energetic Carbon Ions 13C+ on Tungsten Surfaces
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000863536 520__ $$aThe effect of surface roughness on angular distributions of reflected and physically sputtered particles is investigated by ultra-high vacuum (UHV) ion-surface interaction experiments. For this purpose, a smooth (Ra = 5.9 nm) and a rough (Ra = 20.5 nm) tungsten (W) surface were bombarded with carbon ions 13C+ under incidence angles of 30° and 80°. Reflected and sputtered particles were collected on foils to measure the resulting angular distribution as a function of surface morphology. For the qualitative and quantitative analysis, secondary ion mass spectrometry (SIMS) and nuclear reaction analysis (NRA) were performed. Simulations of ion-surface interactions were carried out with the SDTrimSP (Static Dynamic Transport of Ions in Matter Sputtering) code. For rough surfaces, a special routine was derived and implemented. Experimental as well as calculated results prove a significant impact of surface roughness on the angular distribution of reflected and sputtered particles. It is demonstrated that the effective sticking of C on W is a function of the angle of incidence and surface morphology. It is found that the predominant ion-surface interaction process changes with fluence
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000863536 7001_ $$0P:(DE-Juel1)158039$$aKöppen, Martin$$b1
000863536 7001_ $$0P:(DE-Juel1)130036$$aHiller, Albert$$b2$$ufzj
000863536 7001_ $$0P:(DE-Juel1)130066$$aKoslowski, Hans$$b3$$ufzj
000863536 7001_ $$0P:(DE-Juel1)130090$$aLitnovsky, Andrey$$b4$$ufzj
000863536 7001_ $$0P:(DE-HGF)0$$aSchmid, Klaus$$b5
000863536 7001_ $$0P:(DE-HGF)0$$aSchwab, Christian$$b6
000863536 7001_ $$0P:(DE-HGF)0$$aDe Souza, Roger$$b7
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