Hauptseite > Externe Publikationen > Vita Publikationen > Segregation of point defects at the CuInSe2(001)/GaAs(001) interface |
Journal Article | FZJ-2019-04057 |
;
2019
Elsevier Science
New York, NY [u.a.]
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Please use a persistent id in citations: doi:10.1016/j.ssc.2019.113652
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