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@ARTICLE{Niu:864302,
      author       = {Niu, Yue and Gonzalez-Abad, Sergio and Frisenda, Riccardo
                      and Marauhn, Philipp and Drüppel, Matthias and Gant,
                      Patricia and Schmidt, Robert and Taghavi, Najme and Barcons,
                      David and Molina-Mendoza, Aday and de Vasconcellos, Steffen
                      and Bratschitsch, Rudolf and Perez De Lara, David and
                      Rohlfing, Michael and Castellanos-Gomez, Andres},
      title        = {{T}hickness-{D}ependent {D}ifferential {R}eflectance
                      {S}pectra of {M}onolayer and {F}ew-{L}ayer {M}o{S}$_2$,
                      {M}o{S}e$_2$, {WS}$_2$ and {WS}e$_2$},
      journal      = {Nanomaterials},
      volume       = {8},
      number       = {9},
      issn         = {2079-4991},
      address      = {Basel},
      publisher    = {MDPI},
      reportid     = {FZJ-2019-04117},
      pages        = {725 -},
      year         = {2018},
      ddc          = {540},
      pnm          = {899 - ohne Topic (POF3-899) / Spectra of 2D layered
                      materials $(hms17_20140501)$},
      pid          = {G:(DE-HGF)POF3-899 / $G:(DE-Juel1)hms17_20140501$},
      typ          = {PUB:(DE-HGF)16},
      doi          = {10.3390/nano8090725},
      url          = {https://juser.fz-juelich.de/record/864302},
}