%0 Journal Article
%A Flatten, Tim
%A Matthes, Frank
%A Petruhins, Andrejs
%A Salikhov, Ruslan
%A Wiedwald, Ulf
%A Farle, Michael
%A Rosen, Johanna
%A Bürgler, Daniel E.
%A Schneider, Claus M.
%T Direct measurement of anisotropic conductivity in a nanolaminated (Mn 0.5 Cr 0.5 ) 2 GaC thin film
%J Applied physics letters
%V 115
%N 9
%@ 1077-3118
%C Melville, NY
%I American Inst. of Physics
%M FZJ-2019-04778
%P 094101 -
%D 2019
%X The direct and parameter-free measurement of anisotropic electrical resistivity of a magnetic Mn+1AXn (MAX) phase film is presented. A multitip scanning tunneling microscope is used to carry out 4-probe transport measurements with variable probe spacing s. The observation of the crossover from the 3D regime for small s to the 2D regime for large s enables the determination of both in-plane and perpendicular-to-plane resistivities ρab and ρc. A (Cr0.5Mn0.5)2GaC MAX phase film shows a large anisotropy ratio ρc/ρab=525±49. This is a consequence of the complex bonding scheme of MAX phases with covalent M–X and metallic M–M bonds in the MX planes and predominately covalent, but weaker bonds between the MX and A planes.
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000483884100034
%R 10.1063/1.5115347
%U https://juser.fz-juelich.de/record/865255