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000865255 1001_ $$00000-0003-4461-3813$$aFlatten, Tim$$b0$$eCorresponding author
000865255 245__ $$aDirect measurement of anisotropic conductivity in a nanolaminated (Mn 0.5 Cr 0.5 ) 2 GaC thin film
000865255 260__ $$aMelville, NY$$bAmerican Inst. of Physics$$c2019
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000865255 520__ $$aThe direct and parameter-free measurement of anisotropic electrical resistivity of a magnetic Mn+1AXn (MAX) phase film is presented. A multitip scanning tunneling microscope is used to carry out 4-probe transport measurements with variable probe spacing s. The observation of the crossover from the 3D regime for small s to the 2D regime for large s enables the determination of both in-plane and perpendicular-to-plane resistivities ρab and ρc. A (Cr0.5Mn0.5)2GaC MAX phase film shows a large anisotropy ratio ρc/ρab=525±49. This is a consequence of the complex bonding scheme of MAX phases with covalent M–X and metallic M–M bonds in the MX planes and predominately covalent, but weaker bonds between the MX and A planes.
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000865255 7001_ $$0P:(DE-Juel1)130822$$aMatthes, Frank$$b1
000865255 7001_ $$00000-0002-9745-5380$$aPetruhins, Andrejs$$b2
000865255 7001_ $$00000-0001-8461-0743$$aSalikhov, Ruslan$$b3
000865255 7001_ $$00000-0002-3209-4078$$aWiedwald, Ulf$$b4
000865255 7001_ $$00000-0002-1864-3261$$aFarle, Michael$$b5
000865255 7001_ $$0P:(DE-HGF)0$$aRosen, Johanna$$b6
000865255 7001_ $$0P:(DE-Juel1)130582$$aBürgler, Daniel E.$$b7
000865255 7001_ $$0P:(DE-Juel1)130948$$aSchneider, Claus M.$$b8
000865255 773__ $$0PERI:(DE-600)1469436-0$$a10.1063/1.5115347$$gVol. 115, no. 9, p. 094101 -$$n9$$p094101 -$$tApplied physics letters$$v115$$x1077-3118$$y2019
000865255 8564_ $$uhttps://juser.fz-juelich.de/record/865255/files/1.5115347.pdf$$yPublished on 2019-08-28. Available in OpenAccess from 2020-08-28.
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