TY  - JOUR
AU  - Flatten, Tim
AU  - Matthes, Frank
AU  - Petruhins, Andrejs
AU  - Salikhov, Ruslan
AU  - Wiedwald, Ulf
AU  - Farle, Michael
AU  - Rosen, Johanna
AU  - Bürgler, Daniel E.
AU  - Schneider, Claus M.
TI  - Direct measurement of anisotropic conductivity in a nanolaminated (Mn 0.5 Cr 0.5 ) 2 GaC thin film
JO  - Applied physics letters
VL  - 115
IS  - 9
SN  - 1077-3118
CY  - Melville, NY
PB  - American Inst. of Physics
M1  - FZJ-2019-04778
SP  - 094101 -
PY  - 2019
AB  - The direct and parameter-free measurement of anisotropic electrical resistivity of a magnetic Mn+1AXn (MAX) phase film is presented. A multitip scanning tunneling microscope is used to carry out 4-probe transport measurements with variable probe spacing s. The observation of the crossover from the 3D regime for small s to the 2D regime for large s enables the determination of both in-plane and perpendicular-to-plane resistivities ρab and ρc. A (Cr0.5Mn0.5)2GaC MAX phase film shows a large anisotropy ratio ρc/ρab=525±49. This is a consequence of the complex bonding scheme of MAX phases with covalent M–X and metallic M–M bonds in the MX planes and predominately covalent, but weaker bonds between the MX and A planes.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000483884100034
DO  - DOI:10.1063/1.5115347
UR  - https://juser.fz-juelich.de/record/865255
ER  -