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@ARTICLE{Flatten:865255,
author = {Flatten, Tim and Matthes, Frank and Petruhins, Andrejs and
Salikhov, Ruslan and Wiedwald, Ulf and Farle, Michael and
Rosen, Johanna and Bürgler, Daniel E. and Schneider, Claus
M.},
title = {{D}irect measurement of anisotropic conductivity in a
nanolaminated ({M}n 0.5 {C}r 0.5 ) 2 {G}a{C} thin film},
journal = {Applied physics letters},
volume = {115},
number = {9},
issn = {1077-3118},
address = {Melville, NY},
publisher = {American Inst. of Physics},
reportid = {FZJ-2019-04778},
pages = {094101 -},
year = {2019},
abstract = {The direct and parameter-free measurement of anisotropic
electrical resistivity of a magnetic Mn+1AXn (MAX) phase
film is presented. A multitip scanning tunneling microscope
is used to carry out 4-probe transport measurements with
variable probe spacing s. The observation of the crossover
from the 3D regime for small s to the 2D regime for large s
enables the determination of both in-plane and
perpendicular-to-plane resistivities ρab and ρc. A
(Cr0.5Mn0.5)2GaC MAX phase film shows a large anisotropy
ratio ρc/ρab=525±49. This is a consequence of the complex
bonding scheme of MAX phases with covalent M–X and
metallic M–M bonds in the MX planes and predominately
covalent, but weaker bonds between the MX and A planes.},
cin = {PGI-6},
ddc = {530},
cid = {I:(DE-Juel1)PGI-6-20110106},
pnm = {522 - Controlling Spin-Based Phenomena (POF3-522)},
pid = {G:(DE-HGF)POF3-522},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000483884100034},
doi = {10.1063/1.5115347},
url = {https://juser.fz-juelich.de/record/865255},
}