Simulation of abrupt SET and gradual RESET behavior in variable HfO2/TiOx ReRAM cells - JuSER

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Conference Presentation (Other)

Simulation of abrupt SET and gradual RESET behavior in variable HfO2/TiOx ReRAM cells

Bengel, C. ; Cüppers, F.FZJ* ; Funck, C.FZJ* ; Hardtdegen, A.FZJ* ; Siemon, A. ; Hoffmann-Eifert, S.FZJ* ; Menzel, S.FZJ*

2019

MEMRISYS, Dresden, Germany, 8 Jul 2019 - 11 Jul 2019

Contributing Institute(s):

Research Program(s):

521 - Controlling Electron Charge-Based Phenomena (POF3-521) (POF3-521)

Appears in the scientific report 2019

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Document types > Presentations > Conference Presentations
JARA > JARA > JARA-JARA\-FIT
Institute Collections > PGI > PGI-7
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Record created 2019-10-10, last modified 2021-01-30

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