%0 Journal Article
%A Womack, F. N.
%A Adams, P. W.
%A Valles, J. M.
%A Catelani, Gianluigi
%T Critical field behavior of a multiply connected superconductor in a tilted magnetic field
%J Physical review / B
%V 100
%N 17
%@ 2469-9950
%C Woodbury, NY
%I Inst.
%M FZJ-2019-05367
%P 174505
%D 2019
%X We report magnetotransport measurements of the critical field behavior of thin Al films deposited onto multiply connected substrates. The substrates were fabricated via a standard electrochemical process that produced a triangular array of 66-nm-diameter holes having a lattice constant of 100 nm. The critical field transition of the Al films was measured near Tc as a function of field orientation relative to the substrate normal. With the field oriented along the normal (θ=0), we observe reentrant superconductivity at a characteristic matching field Hm=0.22 T, corresponding to one flux quantum per hole. In tilted fields, the position H∗ of the reentrance feature increases as sec(θ), but the resistivity traces are somewhat more complex than those of a continuous superconducting film. We show that when the tilt angle is tuned such that H∗ is of the order of the upper critical field Hc, the entire critical region is dominated by the enhanced dissipation associated with a submatching perpendicular component of the applied field. At higher tilt angles a local maximum in the critical field is observed when the perpendicular component of the field is equal to the matching field.
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000495041000002
%R 10.1103/PhysRevB.100.174505
%U https://juser.fz-juelich.de/record/866196