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@ARTICLE{Tusche:866484,
author = {Tusche, Christian and Chen, Ying-Jiun and Schneider, Claus
M. and Kirschner, Jürgen},
title = {{I}maging properties of hemispherical electrostatic energy
analyzers for high resolution momentum microscopy},
journal = {Ultramicroscopy},
volume = {206},
issn = {0304-3991},
address = {Amsterdam},
publisher = {Elsevier Science},
reportid = {FZJ-2019-05586},
pages = {112815 -},
year = {2019},
abstract = {Hemispherical deflection analyzers are the most widely used
energy filters for state-of-the-art electron spectroscopy.
Due to the high spherical symmetry, they are also well
suited as imaging energy filters for electron microscopy.
Here, we review the imaging properties of hemispherical
deflection analyzers with emphasis on the application for
cathode lens microscopy. In particular, it turns out that
aberrations, in general limiting the image resolution,
cancel out at the entrance and exit of the analyzer. This
finding allows more compact imaging energy filters for
momentum microscopy or photoelectron emission microscopy.
For instance, high resolution imaging is possible, using
only a single hemisphere. Conversely, a double pass
hemispherical analyzer can double the energy dispersion,
which means it can double the energy resolution at certain
transmission, or can multiply the transmission at certain
energy resolution.},
cin = {PGI-6},
ddc = {570},
cid = {I:(DE-Juel1)PGI-6-20110106},
pnm = {522 - Controlling Spin-Based Phenomena (POF3-522)},
pid = {G:(DE-HGF)POF3-522},
typ = {PUB:(DE-HGF)16},
pubmed = {pmid:31325896},
UT = {WOS:000500325600010},
doi = {10.1016/j.ultramic.2019.112815},
url = {https://juser.fz-juelich.de/record/866484},
}