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@ARTICLE{Mallik:867730,
      author       = {Mallik, Srijani and Syed Mohd, Amir and Koutsioumpas,
                      Alexandros and Mattauch, Stefan and Satpati, Biswarup and
                      Brückel, Thomas and Bedanta, Subhankar},
      title        = {{T}uning spinterface properties in iron/fullerene thin
                      films},
      journal      = {Nanotechnology},
      volume       = {30},
      number       = {43},
      issn         = {1361-6528},
      address      = {Bristol},
      publisher    = {IOP Publ.},
      reportid     = {FZJ-2019-06345},
      pages        = {435705 -},
      year         = {2019},
      abstract     = {In ferromagnetic (FM) metal/organic semiconductor (OSC)
                      heterostructures charge transfer can occur which leads to
                      induction of magnetism in the non-magnetic OSC. This
                      phenomenon has been described by the change in the density
                      of states in the OSC which leads to a finite magnetic moment
                      at the OSC interface and it is called the ‘spinterface’.
                      One of the main motivations in this field of organic
                      spintronics is how to control the magnetic moment in the
                      spinterface. In this regard, there are several open
                      questions such as (i) which combination of FM and OSC can
                      lead to more moment at the spinterface? (ii) Is the
                      thickness of OSC also important? (iii) How does the
                      spinterface moment vary with the FM thickness? (iv) Does the
                      crystalline quality of the FM matter? (v) What is the effect
                      of spinterface on magnetization reversal, domain structure
                      and anisotropy? In this context, we have tried to answer the
                      last four issues in this paper by studying Fe/C60 bilayers
                      of variable Fe thickness deposited on Si substrates. We find
                      that both the induced moment and thickness of the
                      spinterface vary proportionally with the Fe thickness. Such
                      behavior is explained in terms of the growth quality of the
                      Fe layer on the native oxide of the Si (100) substrate. The
                      magnetization reversal, domain structure and anisotropy of
                      these bilayer samples were studied and compared with their
                      respective reference samples without the C60 layer. It is
                      observed that the formation of spinterface leads to a
                      reduction in uniaxial anisotropy in Fe/C60 on Si (100) in
                      comparison to their reference samples.},
      cin          = {JCNS-FRM-II / JCNS-2 / MLZ},
      ddc          = {530},
      cid          = {I:(DE-Juel1)JCNS-FRM-II-20110218 /
                      I:(DE-Juel1)JCNS-2-20110106 / I:(DE-588b)4597118-3},
      pnm          = {6G15 - FRM II / MLZ (POF3-6G15) / 6G4 - Jülich Centre for
                      Neutron Research (JCNS) (POF3-623)},
      pid          = {G:(DE-HGF)POF3-6G15 / G:(DE-HGF)POF3-6G4},
      experiment   = {EXP:(DE-MLZ)MARIA-20140101},
      typ          = {PUB:(DE-HGF)16},
      pubmed       = {pmid:31342941},
      UT           = {WOS:000481696700002},
      doi          = {10.1088/1361-6528/ab3554},
      url          = {https://juser.fz-juelich.de/record/867730},
}