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@ARTICLE{Hollermann:867960,
author = {Hollermann, Henning and Lange, Felix R. L. and Jakobs,
Stefan and Kerres, Peter and Wuttig, Matthias},
title = {{S}toichiometry {D}etermination of {C}halcogenide
{S}uperlattices by {M}eans of {X}‐{R}ay {D}iffraction and
its {L}imits},
journal = {Physica status solidi / Rapid research letters Rapid
research letters [...]},
volume = {13},
number = {4},
issn = {1862-6270},
address = {Weinheim},
publisher = {Wiley-VCH},
reportid = {FZJ-2019-06553},
pages = {1800577 -},
year = {2019},
abstract = {In this paper, the potential of stoichiometry determination
for chalcogenide superlattices, promising candidates for
next‐generation phase‐change memory, via X‐ray
diffraction is explored. To this end, a set of epitaxial
GeTe/Sb2Te3 superlattice samples with varying layer
thicknesses is sputter deposited. Kinematical scattering
theory is employed to link the average composition with the
diffraction features. The observed lattice constants of the
superlattice reference unit cell follow Vegard's law,
enabling a straight‐forward and non‐destructive
stoichiometry determination.},
cin = {PGI-10},
ddc = {530},
cid = {I:(DE-Juel1)PGI-10-20170113},
pnm = {521 - Controlling Electron Charge-Based Phenomena
(POF3-521)},
pid = {G:(DE-HGF)POF3-521},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000465029000003},
doi = {10.1002/pssr.201800577},
url = {https://juser.fz-juelich.de/record/867960},
}