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@ARTICLE{Pandey:868010,
      author       = {Pandey, Nidhi and Pütter, S. and Syed Mohd, Amir and
                      Reddy, V. R. and Phase, D. M. and Stahn, J. and Gupta, Ajay
                      and Gupta, M.},
      title        = {{E}ffect of interfacial interdiffusion on magnetism in
                      epitaxial {F}e$_4${N} films on {L}a{A}l{O}$_3$ substrates},
      journal      = {Physical review materials},
      volume       = {3},
      number       = {11},
      issn         = {2475-9953},
      address      = {College Park, MD},
      publisher    = {APS},
      reportid     = {FZJ-2019-06603},
      pages        = {114414},
      year         = {2019},
      abstract     = {Epitaxial Fe$_4$N thin films grown on LaAlO$_3$ (LAO)
                      substrate using sputtering and molecular beam epitaxy
                      techniques have been studied in this work. Within the
                      sputtering process, films were grown with conventional
                      direct current magnetron sputtering (dcMS) and using a high
                      power impulse magnetron sputtering (HiPIMS) process. Surface
                      morphology and depth profile studies on these samples reveal
                      that HiPIMS deposited film has the lowest roughness, the
                      highest packing density, and the sharpest interface. We
                      found that the substrate-film interface and the
                      microstructure play a vital role in affecting the electronic
                      hybridization and magnetic properties of Fe$_4$N films. La
                      from the LAO substrate and Fe from the film interdiffuse and
                      form an undesired interface. The magnetic moment (M$_s$) was
                      compared using bulk, element-specific and magnetic depth
                      profiling techniques. We found that M$_s$ was the highest
                      when the thickness of the interdiffused layer was lowest and
                      such conditions can only be achieved in the HiPIMS grown
                      samples. The presence of a small moment at the N site was
                      also evidenced by element-specific x-ray circular dichroism
                      measurement in the HiPIMS grown sample. A large variation in
                      the M$_s$ values of Fe$_4$N films found in the experimental
                      works carried out so far could be due to such an
                      interdiffused layer which is generally not expected to form
                      in otherwise stable oxide substrate at a low substrate
                      temperature ≈675 K. In addition, a consequence of
                      substrate-film interdiffusion and microstructure resulted in
                      the different kinds of magnetic anisotropies in Fe$_4$N
                      films grown using different techniques. A detailed
                      investigation of the substrate-film interface and
                      microstructure on the magnetization of Fe$_4$N film is
                      presented and discussed in this work.},
      cin          = {JCNS-FRM-II / JCNS-2 / MLZ},
      ddc          = {530},
      cid          = {I:(DE-Juel1)JCNS-FRM-II-20110218 /
                      I:(DE-Juel1)JCNS-2-20110106 / I:(DE-588b)4597118-3},
      pnm          = {6212 - Quantum Condensed Matter: Magnetism,
                      Superconductivity (POF3-621) / 6G4 - Jülich Centre for
                      Neutron Research (JCNS) (POF3-623) / 6G15 - FRM II / MLZ
                      (POF3-6G15)},
      pid          = {G:(DE-HGF)POF3-6212 / G:(DE-HGF)POF3-6G4 /
                      G:(DE-HGF)POF3-6G15},
      experiment   = {EXP:(DE-MLZ)MBE-MLZ-20151210 / EXP:(DE-MLZ)MARIA-20140101},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000498902800003},
      doi          = {10.1103/PhysRevMaterials.3.114414},
      url          = {https://juser.fz-juelich.de/record/868010},
}