Hauptseite > Workflowsammlungen > Publikationsgebühren > A new neutron depth profiling spectrometer at the JCNS for a focused neutron beam > print

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024 7 _ |a 10.1080/10420150.2019.1701466
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100 1 _ |a Vezhlev, E.
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245 _ _ |a A new neutron depth profiling spectrometer at the JCNS for a focused neutron beam
260 _ _ |a London [u.a.]
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520 _ _ |a A new neutron depth profiling (NDP) spectrometer has been designed and built for the use at a high intensity focused cold neutron beam of the reflectometer MARIA at the Heinz Maier-Leibnitz Zentrum (MLZ, Germany). The extremely high neutron flux at the sample position of MARIA joined with the multiple charged particle detectors allows less than 10 s sampling rate and paves the way to study the kinetics of Li ions in thin-film microbatteries. The performance of the spectrometer with standard calibration samples and LiNbO3 amorphous thin films is presented; possibilities to operando study the Li distribution inside thin-film rechargeable lithium batteries are discussed.
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693 _ _ |a Forschungs-Neutronenquelle Heinz Maier-Leibnitz
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700 1 _ |a Felder, Ch.
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700 1 _ |a Hüger, E.
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700 1 _ |a Vacik, J.
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700 1 _ |a Tomandl, I.
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700 1 _ |a Hnatowicz, V.
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700 1 _ |a Chen, Chunguang
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700 1 _ |a Notten, P. H. L.
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700 1 _ |a Brückel, Th.
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773 _ _ |a 10.1080/10420150.2019.1701466
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