% IMPORTANT: The following is UTF-8 encoded.  This means that in the presence
% of non-ASCII characters, it will not work with BibTeX 0.99 or older.
% Instead, you should use an up-to-date BibTeX implementation like “bibtex8” or
% “biber”.

@ARTICLE{Kumar:873379,
      author       = {Kumar, S. and Niraula, L. and Arutinov, D. and Mora, A.
                      Dalla and Waasen, S. Van},
      title        = {{T}iming resolution of {S}i{PM} technologies before and
                      after neutron irradiation},
      journal      = {Journal of Instrumentation},
      volume       = {15},
      number       = {01},
      issn         = {1748-0221},
      address      = {London},
      publisher    = {Inst. of Physics},
      reportid     = {FZJ-2020-00691},
      pages        = {C01023 - C01023},
      year         = {2020},
      abstract     = {In recent years, silicon photomultiplier (SiPM) technology
                      has been getting attention from various applications due to
                      its low cost, immunity to magnetic field, compactness and
                      ruggedness. However, its applicability in experiments with
                      harsh radiation environments is still limited due to lack of
                      corresponding radiation damage studies. A 10-year lifetime
                      operation in a typical Small Angle Neutron Scattering (SANS)
                      experiment with an acceptable degradation in photon
                      detection efficiency has already been reported. In this
                      article, we discuss the feasibility study of SiPM technology
                      in neutron time of flight experiments. For this purpose, two
                      analog SiPMs, developed by SensL and Hamamatsu, have been
                      irradiated with cold neutrons (5 Å ) up to a dose of
                      6⋅1012 n/cm2 at the KWS-1 instrument of the Heinz
                      Maier-Leibnitz Zentrum (MLZ) in Germany. After irradiation,
                      the timing resolutions of the SiPMs have been measured under
                      pulsed laser beam with a few hundred photons (405 nm) per
                      pulse, and a degradation of up to 6 ps has been observed.
                      The degradation might be a result of noise increase,
                      introduced by surface defects caused by neutron exposure
                      damage. Additionally, variation of the excess voltage helped
                      to reveal the difference in the timing resolutions between
                      irradiated and non-irradiated SiPMs, which remained almost
                      constant.},
      cin          = {JCNS-FRM-II / JCNS-2 / ZEA-2 / MLZ},
      ddc          = {610},
      cid          = {I:(DE-Juel1)JCNS-FRM-II-20110218 /
                      I:(DE-Juel1)JCNS-2-20110106 / I:(DE-Juel1)ZEA-2-20090406 /
                      I:(DE-588b)4597118-3},
      pnm          = {6G4 - Jülich Centre for Neutron Research (JCNS) (POF3-623)
                      / 6G15 - FRM II / MLZ (POF3-6G15)},
      pid          = {G:(DE-HGF)POF3-6G4 / G:(DE-HGF)POF3-6G15},
      experiment   = {EXP:(DE-MLZ)KWS1-20140101},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000525449100023},
      doi          = {10.1088/1748-0221/15/01/C01023},
      url          = {https://juser.fz-juelich.de/record/873379},
}