Conference Presentation (Invited) FZJ-2020-01009

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png
Evaluation of the switching dynamics of HfO2/TiOx ReRAM devices for reliable analog memristive behavior

 ;  ;  ;  ;  ;  ;  ;

2019

Materials Research Society Meeting, BostonBoston, USA, 16 Sep 2019 - 19 Sep 20192019-09-162019-09-19


Contributing Institute(s):
  1. Elektronische Materialien (PGI-7)
  2. JARA Institut Green IT (PGI-10)
  3. JARA-FIT (JARA-FIT)
Research Program(s):
  1. 524 - Controlling Collective States (POF3-524) (POF3-524)

Appears in the scientific report 2019
Click to display QR Code for this record

The record appears in these collections:
Document types > Presentations > Conference Presentations
JARA > JARA > JARA-JARA\-FIT
Institute Collections > PGI > PGI-10
Institute Collections > PGI > PGI-7
Workflow collections > Public records
Publications database

 Record created 2020-02-11, last modified 2021-01-30



Rate this document:

Rate this document:
1
2
3
 
(Not yet reviewed)