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000874192 1001_ $$0P:(DE-Juel1)166372$$aJiang, XI$$b0$$eCorresponding author$$ufzj
000874192 245__ $$aReversed-slit spectroscopy method for in situ measurement of H isotopes on plasma facing material
000874192 260__ $$aLondon$$bInst. of Physics$$c2020
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000874192 520__ $$aOptic spectroscopy methods are employed for plasma facing component (PFC) material diagnostics and H isotopes retention on various platforms. A common issue of those spectroscopy methods is the measurement sensitivity. Various improvement methods have been investigated. In the current work, a 'reversed-slit' method is explored, aiming to maximise signal input while retain a reasonably good line resolution. A thin metal wire with a diameter that is comparable to a normal slit width is placed in front of an open slit. By opening the slit the input of the emission light is maximised. The thin wire casts a line of shadow on the spectral image. The shadow line is used as the 'characteristic line' to identify and separate the spectral line of each H isotope. The result shows that an open slit of 3 mm width can bring an intensity increase of 20–30 times compared to a 100 μm wide normal slit without compromising the resolution.
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000874192 7001_ $$0P:(DE-Juel1)130158$$aSergienko, G.$$b1$$ufzj
000874192 7001_ $$0P:(DE-Juel1)130070$$aKreter, A.$$b2$$ufzj
000874192 7001_ $$0P:(DE-Juel1)129976$$aBrezinsek, S.$$b3$$ufzj
000874192 7001_ $$0P:(DE-Juel1)157640$$aLinsmeier, Ch.$$b4$$ufzj
000874192 773__ $$0PERI:(DE-600)2235672-1$$a10.1088/1748-0221/15/01/C01007$$gVol. 15, no. 01, p. C01007 - C01007$$n01$$pC01007 - C01007$$tJournal of Instrumentation$$v15$$x1748-0221$$y2020
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000874192 8564_ $$uhttps://juser.fz-juelich.de/record/874192/files/Postprint%20Jiang_2020_J._Inst._15_C01007.pdf$$yPublished on 2020-01-08. Available in OpenAccess from 2021-01-08.
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