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| Hauptseite > Publikationsdatenbank > Pitfalls and prospects of optical spectroscopy to characterize perovskite-transport layer interfaces > print |
| Hauptseite > Publikationsdatenbank > Pitfalls and prospects of optical spectroscopy to characterize perovskite-transport layer interfaces > print |
| 001 | 874431 | ||
| 005 | 20240712084510.0 | ||
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| 100 | 1 | _ | |a Hutter, Eline M. |0 0000-0002-5537-6545 |b 0 |
| 245 | _ | _ | |a Pitfalls and prospects of optical spectroscopy to characterize perovskite-transport layer interfaces |
| 260 | _ | _ | |a Melville, NY |c 2020 |b American Inst. of Physics |
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| 520 | _ | _ | |a Perovskite photovoltaics has witnessed an unprecedented increase in power conversion efficiency over the last decade. The choice of transport layers, through which photo-generated electrons and holes are transported to electrodes, is a crucial factor for further improving both the device performance and stability. In this perspective, we critically examine the application of optical spectroscopy to characterize the quality of the transport layer-perovskite interface. We highlight the power of complementary studies that use both continuous wave and time-resolved photoluminescence to understand non-radiative losses and additional transient spectroscopies for characterizing the potential for loss-less carrier extraction at the solar cell interfaces. Based on this discussion, we make recommendations on how to extrapolate results from optical measurements to assess the quality of a transport layer and its impact on solar cell efficiency.The work of E.M.H. and B.E. is part of the Dutch Research Council (NWO) and was performed at the research institute AMOLF. T.K. acknowledges the Helmholtz Association for funding via the PEROSEED project. D.C acknowledges funding from the Yotam project and the CNRS-Weizmann collaboration. |
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| 700 | 1 | _ | |a Kirchartz, Thomas |0 P:(DE-Juel1)159457 |b 1 |e Corresponding author |
| 700 | 1 | _ | |a Ehrler, Bruno |0 0000-0002-5307-3241 |b 2 |
| 700 | 1 | _ | |a Cahen, David |0 0000-0001-8118-5446 |b 3 |
| 700 | 1 | _ | |a von Hauff, Elizabeth |0 0000-0002-6269-0540 |b 4 |
| 773 | _ | _ | |a 10.1063/1.5143121 |g Vol. 116, no. 10, p. 100501 - |0 PERI:(DE-600)1469436-0 |n 10 |p 100501 - |t Applied physics letters |v 116 |y 2020 |x 1077-3118 |
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