000875393 001__ 875393
000875393 005__ 20210330091230.0
000875393 0247_ $$2Handle$$a2128/24996
000875393 0247_ $$2ISSN$$a1866-1807
000875393 020__ $$a978-3-95806-460-7
000875393 037__ $$aFZJ-2020-02002
000875393 041__ $$aEnglish
000875393 1001_ $$0P:(DE-Juel1)165237$$aFlatten, Tim$$b0$$eCorresponding author$$gmale$$ufzj
000875393 245__ $$aDirect measurement of anisotropic resistivity in thin films using a 4-probe STM$$f- 2020-05-31
000875393 260__ $$aJülich$$bForschungszentrum Jülich GmbH Zentralbibliothek, Verlag$$c2020
000875393 300__ $$aVIII, 129 S.
000875393 3367_ $$2DataCite$$aOutput Types/Dissertation
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000875393 3367_ $$2ORCID$$aDISSERTATION
000875393 3367_ $$2BibTeX$$aPHDTHESIS
000875393 3367_ $$02$$2EndNote$$aThesis
000875393 3367_ $$0PUB:(DE-HGF)11$$2PUB:(DE-HGF)$$aDissertation / PhD Thesis$$bphd$$mphd$$s1591348967_22460
000875393 3367_ $$2DRIVER$$adoctoralThesis
000875393 4900_ $$aSchriften des Forschungszentrums Jülich. Reihe Schlüsseltechnologien / Key Technologies$$v213
000875393 502__ $$aUniversität Köln, 2019$$bDr.$$cUniversität Köln$$d2019
000875393 520__ $$aFour-point electronic transport measurements have proven to be the best choice for determining the resistance of a sample and thus the resistivity properties, because the contact resistances are negligibly small. Various techniques using the 4-point method have been explored, whereby the 4-probe scanning tunneling microscope is a powerful experimental tool to measure the sample resistance on small length scales including the possibility to vary probe spacings. Nowadays, layered materials are in the focus of interest due to their intriguing fundamental properties and their high potential in a variety of applications. In addition, they are also possible parenting materials for so-called 2D materials due to a typically weaker chemical bonding along one crystalline axis. Beside the famous parent-materials such as graphite, hexagonal boron nitride, and transition metal dichalcogenides, there is a further class of layered materials, namely the so-called MAX phases comprising both metal as well as ceramic properties. This unique combination stems from a complex, anisotropic bonding scheme that leads to an anisotropic conductivity. Growing those layered materials as thin-film samples, they comprise usually a bonding anisotropy perpendicular to the surface. Thus, an anisotropy between the in-plane and out-of-plane conductivities is expected. Such anisotropic electronic transport properties are characterized by introducing the resistivity as a second rank tensor. The resistivity is then expressed by a symmetry-dependent number of independent components that can be determined from resistance measurements along different directions of the sample. The in-plane resistivity components can be easily characterized using several well-known methods, while up to now the out-of-plane resistivity cannot be determined without any additional sample treatment or modication, if a material can only be prepared in thin-film form. Therefore, a novel direct and parameter-free method is developed in this thesis for the accurate determination of the out-of-plane resistivity without any further treatment of the sample. A multi-probe scanning tunneling microscope is used to carry out 4-probe transport measurements with variable probe spacings. The observation of the crossover from the 3D electronic transport regime for small spacings between the probesto the 2D regime for large spacings enables the determination of both in-plane and perpendicular-to-plane resistivities. After working out the analytical description of the method, the experimental procedures for measuring electronic transport properties witha multi-probe scanning tunneling microscope are described, in particular the influences of sample size and shape, surface morphology and grain size, probe-sample contact sizeand as well as the main experimental error sources. [...]
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000875393 9141_ $$y2020
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000875393 9201_ $$0I:(DE-Juel1)PGI-6-20110106$$kPGI-6$$lElektronische Eigenschaften$$x0
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