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000875436 1001_ $$0P:(DE-Juel1)130525$$aBarthel, Juri$$b0$$eCorresponding author
000875436 245__ $$aAngular dependence of fast-electron scattering from materials
000875436 260__ $$aWoodbury, NY$$bInst.$$c2020
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000875436 520__ $$aAngular resolved scanning transmission electron microscopy is an important tool for investigating the properties of materials. However, several recent studies have observed appreciable discrepancies in the angular scattering distribution between experiment and theory. In this paper we discuss a general approach to low-loss inelastic scattering which, when incorporated in the simulations, resolves this problem and also closely reproduces experimental data taken over an extended angular range. We also explore the role of ionic bonding, temperature factors, amorphous layers on the surfaces of the specimen, and static displacements of atoms on the angular scattering distribution. The incorporation of low-loss inelastic scattering in simulations will improve the quantitative usefulness of techniques such as low-angle annular dark-field imaging and position-averaged convergent beam electron diffraction, especially for thicker specimens.
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000875436 7001_ $$00000-0003-4862-4827$$aFindlay, Scott D.$$b3
000875436 7001_ $$0P:(DE-HGF)0$$aAllen, Leslie J.$$b4
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000875436 999C5 $$1S. J. Pennycook$$2Crossref$$9-- missing cx lookup --$$a10.1007/978-1-4419-7200-2$$y2011
000875436 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1038/336565a0
000875436 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1103/PhysRevLett.100.206101
000875436 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1103/PhysRevB.82.104103
000875436 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1016/j.ultramic.2014.08.002
000875436 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1017/S1431927619000497
000875436 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1063/1.1649463
000875436 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1016/j.ultramic.2006.04.019
000875436 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1016/j.ultramic.2010.04.004
000875436 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1103/PhysRevLett.100.025503
000875436 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1038/srep37146
000875436 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1016/j.ultramic.2019.112816
000875436 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1103/PhysRev.107.450
000875436 999C5 $$1R. F. Egerton$$2Crossref$$9-- missing cx lookup --$$a10.1007/978-1-4419-9583-4$$y2011
000875436 999C5 $$1J. C. H. Spence$$2Crossref$$oJ. C. H. Spence High-Resolution Transmission Electron Microscopy: and Associated Techniques 1989$$tHigh-Resolution Transmission Electron Microscopy: and Associated Techniques$$y1989
000875436 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1103/PhysRevLett.40.1293
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000875436 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1016/j.ultramic.2014.10.011
000875436 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1103/PhysRevB.54.12873
000875436 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1143/JPSJ.11.112
000875436 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.17815/jlsrf-2-67
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000875436 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1016/S0304-3991(00)00121-2
000875436 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1063/1.1415766
000875436 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1107/S0108767393013200
000875436 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1107/S0108767391004804
000875436 999C5 $$1E. J. Kirkland$$2Crossref$$9-- missing cx lookup --$$a10.1007/978-1-4419-6533-2$$y2010
000875436 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1107/S0108768195003752
000875436 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1016/j.ultramic.2009.10.001
000875436 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1016/j.ultramic.2018.03.004
000875436 999C5 $$2Crossref$$9-- missing cx lookup --$$a10.1016/j.ultramic.2019.112921
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