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| 001 | 875436 | ||
| 005 | 20230426083219.0 | ||
| 024 | 7 | _ | |a 10.1103/PhysRevB.101.184109 |2 doi |
| 024 | 7 | _ | |a 0163-1829 |2 ISSN |
| 024 | 7 | _ | |a 0556-2805 |2 ISSN |
| 024 | 7 | _ | |a 1050-2947 |2 ISSN |
| 024 | 7 | _ | |a 1094-1622 |2 ISSN |
| 024 | 7 | _ | |a 1095-3795 |2 ISSN |
| 024 | 7 | _ | |a 1098-0121 |2 ISSN |
| 024 | 7 | _ | |a 1538-4489 |2 ISSN |
| 024 | 7 | _ | |a 1550-235X |2 ISSN |
| 024 | 7 | _ | |a 2469-9950 |2 ISSN |
| 024 | 7 | _ | |a 2469-9969 |2 ISSN |
| 024 | 7 | _ | |a 2128/24944 |2 Handle |
| 024 | 7 | _ | |a WOS:000531731600002 |2 WOS |
| 037 | _ | _ | |a FZJ-2020-02031 |
| 082 | _ | _ | |a 530 |
| 100 | 1 | _ | |a Barthel, Juri |0 P:(DE-Juel1)130525 |b 0 |e Corresponding author |
| 245 | _ | _ | |a Angular dependence of fast-electron scattering from materials |
| 260 | _ | _ | |a Woodbury, NY |c 2020 |b Inst. |
| 336 | 7 | _ | |a article |2 DRIVER |
| 336 | 7 | _ | |a Output Types/Journal article |2 DataCite |
| 336 | 7 | _ | |a Journal Article |b journal |m journal |0 PUB:(DE-HGF)16 |s 1597133261_30814 |2 PUB:(DE-HGF) |
| 336 | 7 | _ | |a ARTICLE |2 BibTeX |
| 336 | 7 | _ | |a JOURNAL_ARTICLE |2 ORCID |
| 336 | 7 | _ | |a Journal Article |0 0 |2 EndNote |
| 520 | _ | _ | |a Angular resolved scanning transmission electron microscopy is an important tool for investigating the properties of materials. However, several recent studies have observed appreciable discrepancies in the angular scattering distribution between experiment and theory. In this paper we discuss a general approach to low-loss inelastic scattering which, when incorporated in the simulations, resolves this problem and also closely reproduces experimental data taken over an extended angular range. We also explore the role of ionic bonding, temperature factors, amorphous layers on the surfaces of the specimen, and static displacements of atoms on the angular scattering distribution. The incorporation of low-loss inelastic scattering in simulations will improve the quantitative usefulness of techniques such as low-angle annular dark-field imaging and position-averaged convergent beam electron diffraction, especially for thicker specimens. |
| 536 | _ | _ | |a 143 - Controlling Configuration-Based Phenomena (POF3-143) |0 G:(DE-HGF)POF3-143 |c POF3-143 |f POF III |x 0 |
| 536 | _ | _ | |a JUMPA - Jülich-University of Melbourne Postgraduate Academy (FAQ 151018 SA) |0 G:(DE-Juel-1)FAQ 151018 SA |c FAQ 151018 SA |x 1 |
| 542 | _ | _ | |i 2020-05-12 |2 Crossref |u https://link.aps.org/licenses/aps-default-license |
| 588 | _ | _ | |a Dataset connected to CrossRef |
| 700 | 1 | _ | |a Cattaneo, Mauricio |0 P:(DE-Juel1)177854 |b 1 |
| 700 | 1 | _ | |a Mendis, Budhika G. |0 P:(DE-HGF)0 |b 2 |
| 700 | 1 | _ | |a Findlay, Scott D. |0 0000-0003-4862-4827 |b 3 |
| 700 | 1 | _ | |a Allen, Leslie J. |0 P:(DE-HGF)0 |b 4 |
| 773 | 1 | 8 | |a 10.1103/physrevb.101.184109 |b American Physical Society (APS) |d 2020-05-12 |n 18 |p 184109 |3 journal-article |2 Crossref |t Physical Review B |v 101 |y 2020 |x 2469-9950 |
| 773 | _ | _ | |a 10.1103/PhysRevB.101.184109 |g Vol. 101, no. 18, p. 184109 |0 PERI:(DE-600)2844160-6 |n 18 |p 184109 |t Physical review / B |v 101 |y 2020 |x 2469-9950 |
| 856 | 4 | _ | |u https://juser.fz-juelich.de/record/875436/files/PhysRevB.101.184109.pdf |y OpenAccess |
| 856 | 4 | _ | |u https://juser.fz-juelich.de/record/875436/files/PhysRevB.101.184109.pdf?subformat=pdfa |x pdfa |y OpenAccess |
| 909 | C | O | |o oai:juser.fz-juelich.de:875436 |p openaire |p open_access |p VDB |p driver |p dnbdelivery |
| 910 | 1 | _ | |a Forschungszentrum Jülich |0 I:(DE-588b)5008462-8 |k FZJ |b 0 |6 P:(DE-Juel1)130525 |
| 910 | 1 | _ | |a Forschungszentrum Jülich |0 I:(DE-588b)5008462-8 |k FZJ |b 1 |6 P:(DE-Juel1)177854 |
| 910 | 1 | _ | |a External Institute |0 I:(DE-HGF)0 |k Extern |b 3 |6 0000-0003-4862-4827 |
| 913 | 1 | _ | |a DE-HGF |l Future Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT) |1 G:(DE-HGF)POF3-140 |0 G:(DE-HGF)POF3-143 |2 G:(DE-HGF)POF3-100 |v Controlling Configuration-Based Phenomena |x 0 |4 G:(DE-HGF)POF |3 G:(DE-HGF)POF3 |b Energie |
| 914 | 1 | _ | |y 2020 |
| 915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0200 |2 StatID |b SCOPUS |
| 915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0600 |2 StatID |b Ebsco Academic Search |
| 915 | _ | _ | |a American Physical Society Transfer of Copyright Agreement |0 LIC:(DE-HGF)APS-112012 |2 HGFVOC |
| 915 | _ | _ | |a JCR |0 StatID:(DE-HGF)0100 |2 StatID |b PHYS REV B : 2017 |
| 915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0150 |2 StatID |b Web of Science Core Collection |
| 915 | _ | _ | |a WoS |0 StatID:(DE-HGF)0110 |2 StatID |b Science Citation Index |
| 915 | _ | _ | |a WoS |0 StatID:(DE-HGF)0111 |2 StatID |b Science Citation Index Expanded |
| 915 | _ | _ | |a IF < 5 |0 StatID:(DE-HGF)9900 |2 StatID |
| 915 | _ | _ | |a OpenAccess |0 StatID:(DE-HGF)0510 |2 StatID |
| 915 | _ | _ | |a Peer Review |0 StatID:(DE-HGF)0030 |2 StatID |b ASC |
| 915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)1150 |2 StatID |b Current Contents - Physical, Chemical and Earth Sciences |
| 915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0300 |2 StatID |b Medline |
| 915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0199 |2 StatID |b Clarivate Analytics Master Journal List |
| 920 | _ | _ | |l yes |
| 920 | 1 | _ | |0 I:(DE-Juel1)ER-C-2-20170209 |k ER-C-2 |l Materialwissenschaft u. Werkstofftechnik |x 0 |
| 980 | _ | _ | |a journal |
| 980 | _ | _ | |a VDB |
| 980 | _ | _ | |a I:(DE-Juel1)ER-C-2-20170209 |
| 980 | _ | _ | |a UNRESTRICTED |
| 980 | 1 | _ | |a FullTexts |
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